Interference metrology is a method for achieving high precision detection by phase estimation. The phase sensitivity of a traditional interferometer is subject to the standard quantum limit, while its resolution is co...Interference metrology is a method for achieving high precision detection by phase estimation. The phase sensitivity of a traditional interferometer is subject to the standard quantum limit, while its resolution is constrained by the Rayleigh diffraction limit. The resolution and sensitivity of phase measurement can be enhanced by using quantum metrology. We propose a quantum interference metrology scheme using the entangled squeezed vacuum state, which is obtained using the magic beam splitter, expressed as ｜ψ〉=（｜ξ〉｜0〉＋｜0〉｜ξ〉）/√2＋2/coshr, such as the N00 N state. We derive the phase sensitivity and the resolution of the system with Z detection, project detection, and parity detection. By simulation and analysis, we determine that parity detection is an optimal detection method, which can break through the Rayleigh diffraction limit and the standard quantum limit.展开更多
文摘Interference metrology is a method for achieving high precision detection by phase estimation. The phase sensitivity of a traditional interferometer is subject to the standard quantum limit, while its resolution is constrained by the Rayleigh diffraction limit. The resolution and sensitivity of phase measurement can be enhanced by using quantum metrology. We propose a quantum interference metrology scheme using the entangled squeezed vacuum state, which is obtained using the magic beam splitter, expressed as ｜ψ〉=（｜ξ〉｜0〉＋｜0〉｜ξ〉）/√2＋2/coshr, such as the N00 N state. We derive the phase sensitivity and the resolution of the system with Z detection, project detection, and parity detection. By simulation and analysis, we determine that parity detection is an optimal detection method, which can break through the Rayleigh diffraction limit and the standard quantum limit.
