The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random t...The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random telegraph signal noise in the pixel source follower based on the binomial distribution is set up. The number of electrons captured or released by the oxide traps in the unit time is described as the random variables which obey the binomial distribution. As a result,the output states and the corresponding probabilities of the first and the second samples of the correlated double sampling circuit are acquired. The standard deviation of the output states after the correlated double sampling circuit can be obtained accordingly. In the simulation section, one hundred thousand samples of the source follower MOSFET have been simulated,and the simulation results show that the proposed model has the similar statistical characteristics with the existing models under the effect of the channel length and the density of the oxide trap. Moreover, the noise histogram of the proposed model has been evaluated at different environmental temperatures.展开更多
Large-scale physical model test of 30°inclined strata was conducted to investigate the damage mechanisms during the excavation and overloading using infrared detection.The experiment results were presented with t...Large-scale physical model test of 30°inclined strata was conducted to investigate the damage mechanisms during the excavation and overloading using infrared detection.The experiment results were presented with thermal images which were divided into three stages including a full face excavation stage,a staged excavation stage,and an overloading stage.The obtained results were compared with the previously reported results from horizontal,45?,60?,and vertical strata models.Infrared temperature(IRT)for 30°inclined strata model descended with multiple fluctuations during the full-face excavation.For the staged excavation,the excavation damage zone(EDZ)showed enhanced faulting-like strips as compared in the 45?,60?,and vertical models,indicating the intensified stress redistribution occurred in the adjacent rock mass.In contrast,EDZ for the horizontal strata existed in a plastic-formed manner.During the overloading,abnormal features in the thermal images were observed preceding the coalescence of the propagating cracks.The ultimate failure of the model was due primarily to the floor heave and the roof fall.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant Nos.61372156 and 61405053)the Natural Science Foundation of Zhejiang Province of China(Grant No.LZ13F04001)
文摘The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random telegraph signal noise in the pixel source follower based on the binomial distribution is set up. The number of electrons captured or released by the oxide traps in the unit time is described as the random variables which obey the binomial distribution. As a result,the output states and the corresponding probabilities of the first and the second samples of the correlated double sampling circuit are acquired. The standard deviation of the output states after the correlated double sampling circuit can be obtained accordingly. In the simulation section, one hundred thousand samples of the source follower MOSFET have been simulated,and the simulation results show that the proposed model has the similar statistical characteristics with the existing models under the effect of the channel length and the density of the oxide trap. Moreover, the noise histogram of the proposed model has been evaluated at different environmental temperatures.
基金supported by the National Key Research and Development Plan of China (Grant No. 2016YFC0600901)the National Natural Science Foundation of China (Grant Nos. 51374214, 51134005 & 51574248)+1 种基金the Special Fund of Basic Research and Operating of China University of Mining & Technology, Beijing (Grant No. 2009QL03)the State Scholarship Fund of China
文摘Large-scale physical model test of 30°inclined strata was conducted to investigate the damage mechanisms during the excavation and overloading using infrared detection.The experiment results were presented with thermal images which were divided into three stages including a full face excavation stage,a staged excavation stage,and an overloading stage.The obtained results were compared with the previously reported results from horizontal,45?,60?,and vertical strata models.Infrared temperature(IRT)for 30°inclined strata model descended with multiple fluctuations during the full-face excavation.For the staged excavation,the excavation damage zone(EDZ)showed enhanced faulting-like strips as compared in the 45?,60?,and vertical models,indicating the intensified stress redistribution occurred in the adjacent rock mass.In contrast,EDZ for the horizontal strata existed in a plastic-formed manner.During the overloading,abnormal features in the thermal images were observed preceding the coalescence of the propagating cracks.The ultimate failure of the model was due primarily to the floor heave and the roof fall.
