The presence of wrinkles in a membrane is the main factor that induces surface errors on space planar film reflect-arrays. Based on the commercial finite element (FE) package ABAQUS, a numerical procedure for membrane...The presence of wrinkles in a membrane is the main factor that induces surface errors on space planar film reflect-arrays. Based on the commercial finite element (FE) package ABAQUS, a numerical procedure for membrane wrinkle analysis was set up, and used to analyze a square planar film reflect-array under pure shear force to evaluate its induced wrinkle characteristics. First, the effect of shear force on the wrinkle pattern of the array was studied and validated by experiment. Second, the effect of prestress was studied. When the prestress increases, the quantity of the wrinkles increases, and the amplitude of the wrinkles decreases. Third, the influence of the boundary conditions was investigated. A frame side edge structure has a relatively smooth surface, but also relatively high stress. Finally, the behavior of a joint seam was analyzed. The results indicate that a joint band has a significant influence on the wrinkle pattern of the membrane.展开更多
ZnO（002） films with different thicknesses ranging from 7 to 300 nm were grown on sapphire（006） substrates via metal-organic chemical vapor deposition （MOCVD）. The two-dimensional（2D） planar layer and the three...ZnO（002） films with different thicknesses ranging from 7 to 300 nm were grown on sapphire（006） substrates via metal-organic chemical vapor deposition （MOCVD）. The two-dimensional（2D） planar layer and the three-dimensional（3D） island layer were studied by using of X-ray diffraction（XRD） rocking curves and atomic force microscopy （AFM）. The room temperature photoluminescence （PL） spectra show a blue shift of the peak positions of the uhraviolet（UV） emission with increasing film thickness. The blue shift is remarkably high（393-380 nm） when an increase in film thickness（7-15 nm） is accompanied by the change of structure from a 2D planar layer to a 3D island layer. The PL spectra at 77 K also indicate that there are different transition mechanisms in the film thickness from a 2D planar layer to a 3D island layer near the 2D layer region.展开更多
A planar Hall effect（PHE） is introduced to investigate the magnetization reversal process in single-crystalline iron film grown on a Si（001） substrate.Owing to the domain structure of iron film and the characteris...A planar Hall effect（PHE） is introduced to investigate the magnetization reversal process in single-crystalline iron film grown on a Si（001） substrate.Owing to the domain structure of iron film and the characteristics of PHE,the magnetization switches sharply in an angular range of the external field for two steps of 90° domain wall displacement and one step of 180°domain wall displacement near the easy axis,respectively.However,the magnetization reversal process near the hard axis is completed by only one step of 90° domain wall displacement and then rotates coherently.The magnetization reversal process mechanism near the hard axis seems to be a combination of coherent rotation and domain wall displacement.Furthermore,the domain wall pinning energy and uniaxial magnetic anisotropy energy can also be derived from the PHE measurement.展开更多
The conventional Hall effect is linearly proportional to the field component or magnetization component perpendicular to a film. Despite the increasing theoretical proposals on the Hall effect to the in-plane field or...The conventional Hall effect is linearly proportional to the field component or magnetization component perpendicular to a film. Despite the increasing theoretical proposals on the Hall effect to the in-plane field or magnetization in various special systems induced by the Berry curvature, such an unconventional Hall effect has only been experimentally reported in Weyl semimetals and in a heterodimensional superlattice. Here, we report an unambiguous experimental observation of the antisymmetric planar Hall effect(APHE) with respect to the in-plane magnetic field in centrosymmetric rutile RuO_(2) and IrO_(2) single-crystal films. The measured Hall resistivity is found to be linearly proportional to the component of the applied in-plane magnetic field along a particular crystal axis and to be independent of the current direction or temperature. Both the experimental observations and theoretical calculations confirm that the APHE in rutile oxide films is induced by the Lorentz force. Our findings can be generalized to ferromagnetic materials for the discovery of anomalous Hall effects and quantum anomalous Hall effects induced by in-plane magnetization. In addition to significantly expanding knowledge of the Hall effect, this work opens the door to explore new members in the Hall effect family.展开更多
Hybrid ZnO/ormosils films are prepared by the sol-gel method. A FT-IR spectrometer, 900 UV/VIS/NIR spectrophotometer, atomic force microscope, and ellipsometer are employed to investigate microstructure and optical pr...Hybrid ZnO/ormosils films are prepared by the sol-gel method. A FT-IR spectrometer, 900 UV/VIS/NIR spectrophotometer, atomic force microscope, and ellipsometer are employed to investigate microstructure and optical properties of the films fired at different temperatures. The results show that the films with high transmittance and low surface roughness could be obtained at the heat-treatment temperature of 150℃, the refractive index and thickness of the film are 1.413, 2.11μm, respectively. Higher temperatures （350℃, 550℃） change the film microstructure severely, and then decrease the transmittance of the films,展开更多
The polymer spin coating is critical in flexible electronic manufaction and micro-electro-mechanical system（MEMS）devices due to its simple operation, and uniformly coated layers. Some researchers focus on the effect...The polymer spin coating is critical in flexible electronic manufaction and micro-electro-mechanical system（MEMS）devices due to its simple operation, and uniformly coated layers. Some researchers focus on the effects of spin coating parameters such as wafer rotating speed, the viscosity of the coating liquid and solvent evaporation on final film thickness.In this work, the influence of substrate curvature on film thickness distribution is considered. A new parameter which represents the edge bead effect ratio（re） is proposed to investigate the influence factor of edge bead effect. Several operation parameters including the curvature of the substrate and the wafer-spin speed are taken into account to study the effects on the film thickness uniformity and edge-bead ratio. The morphologies and film thickness values of the spin-coated PDMS films under various substrate curvatures and coating speeds are measured with laser confocal microscopy. According to the results, both the convex and concave substrate will help to reduce the edge-bead effect significantly and thin film with better surface morphology can be obtained at high spin speed. Additionally, the relationship between the edge-bead ratio and the thin film thickness is like parabolic curve instead of linear dependence. This work may contribute to the mass production of flexible electronic devices.展开更多
基金Project (Nos. 50878128 and 50808122) supported by the National Natural Science Foundation of China
文摘The presence of wrinkles in a membrane is the main factor that induces surface errors on space planar film reflect-arrays. Based on the commercial finite element (FE) package ABAQUS, a numerical procedure for membrane wrinkle analysis was set up, and used to analyze a square planar film reflect-array under pure shear force to evaluate its induced wrinkle characteristics. First, the effect of shear force on the wrinkle pattern of the array was studied and validated by experiment. Second, the effect of prestress was studied. When the prestress increases, the quantity of the wrinkles increases, and the amplitude of the wrinkles decreases. Third, the influence of the boundary conditions was investigated. A frame side edge structure has a relatively smooth surface, but also relatively high stress. Finally, the behavior of a joint seam was analyzed. The results indicate that a joint band has a significant influence on the wrinkle pattern of the membrane.
基金Supported by the National Natural Science Foundation of China(Nos. 20071013 and 20301007).
文摘ZnO（002） films with different thicknesses ranging from 7 to 300 nm were grown on sapphire（006） substrates via metal-organic chemical vapor deposition （MOCVD）. The two-dimensional（2D） planar layer and the three-dimensional（3D） island layer were studied by using of X-ray diffraction（XRD） rocking curves and atomic force microscopy （AFM）. The room temperature photoluminescence （PL） spectra show a blue shift of the peak positions of the uhraviolet（UV） emission with increasing film thickness. The blue shift is remarkably high（393-380 nm） when an increase in film thickness（7-15 nm） is accompanied by the change of structure from a 2D planar layer to a 3D island layer. The PL spectra at 77 K also indicate that there are different transition mechanisms in the film thickness from a 2D planar layer to a 3D island layer near the 2D layer region.
基金supported by the National Basic Research Program of China(Grant Nos.2011CB921801 and 2012CB933102)the National Natural Science Foundation of China(Grant Nos.11374350,11034004,11274361,11274033,11474015,and 61227902)the Research Fund for the Doctoral Program of Higher Education of China(Grant No.20131102130005)
文摘A planar Hall effect（PHE） is introduced to investigate the magnetization reversal process in single-crystalline iron film grown on a Si（001） substrate.Owing to the domain structure of iron film and the characteristics of PHE,the magnetization switches sharply in an angular range of the external field for two steps of 90° domain wall displacement and one step of 180°domain wall displacement near the easy axis,respectively.However,the magnetization reversal process near the hard axis is completed by only one step of 90° domain wall displacement and then rotates coherently.The magnetization reversal process mechanism near the hard axis seems to be a combination of coherent rotation and domain wall displacement.Furthermore,the domain wall pinning energy and uniaxial magnetic anisotropy energy can also be derived from the PHE measurement.
基金supported by the National Key Research and Development Program of China (2022YFA1403300)the National Natural Science Foundation of China (11974079, 12274083, 12221004, 12174028, 52231007, 51725101, and 11727807)+2 种基金the Shanghai Municipal Science and Technology Major Project (2019SHZDZX01)the Shanghai Municipal Science and Technology Basic Research Project (22JC1400200 and 23dz2260100)the National Key Research and Development Program of China (2021YFA1200600 and 2018YFA0209100)。
文摘The conventional Hall effect is linearly proportional to the field component or magnetization component perpendicular to a film. Despite the increasing theoretical proposals on the Hall effect to the in-plane field or magnetization in various special systems induced by the Berry curvature, such an unconventional Hall effect has only been experimentally reported in Weyl semimetals and in a heterodimensional superlattice. Here, we report an unambiguous experimental observation of the antisymmetric planar Hall effect(APHE) with respect to the in-plane magnetic field in centrosymmetric rutile RuO_(2) and IrO_(2) single-crystal films. The measured Hall resistivity is found to be linearly proportional to the component of the applied in-plane magnetic field along a particular crystal axis and to be independent of the current direction or temperature. Both the experimental observations and theoretical calculations confirm that the APHE in rutile oxide films is induced by the Lorentz force. Our findings can be generalized to ferromagnetic materials for the discovery of anomalous Hall effects and quantum anomalous Hall effects induced by in-plane magnetization. In addition to significantly expanding knowledge of the Hall effect, this work opens the door to explore new members in the Hall effect family.
文摘Hybrid ZnO/ormosils films are prepared by the sol-gel method. A FT-IR spectrometer, 900 UV/VIS/NIR spectrophotometer, atomic force microscope, and ellipsometer are employed to investigate microstructure and optical properties of the films fired at different temperatures. The results show that the films with high transmittance and low surface roughness could be obtained at the heat-treatment temperature of 150℃, the refractive index and thickness of the film are 1.413, 2.11μm, respectively. Higher temperatures （350℃, 550℃） change the film microstructure severely, and then decrease the transmittance of the films,
基金supported by the National Natural Science Foundation of China(Grant Nos.51605079 and 51475076)the Science Fund for Creative Research Groups of the National Natural Science Foundation of China(Grant No.51621064)the China Postdoctoral Science Foundation(Grant No.2016M591424)
文摘The polymer spin coating is critical in flexible electronic manufaction and micro-electro-mechanical system（MEMS）devices due to its simple operation, and uniformly coated layers. Some researchers focus on the effects of spin coating parameters such as wafer rotating speed, the viscosity of the coating liquid and solvent evaporation on final film thickness.In this work, the influence of substrate curvature on film thickness distribution is considered. A new parameter which represents the edge bead effect ratio（re） is proposed to investigate the influence factor of edge bead effect. Several operation parameters including the curvature of the substrate and the wafer-spin speed are taken into account to study the effects on the film thickness uniformity and edge-bead ratio. The morphologies and film thickness values of the spin-coated PDMS films under various substrate curvatures and coating speeds are measured with laser confocal microscopy. According to the results, both the convex and concave substrate will help to reduce the edge-bead effect significantly and thin film with better surface morphology can be obtained at high spin speed. Additionally, the relationship between the edge-bead ratio and the thin film thickness is like parabolic curve instead of linear dependence. This work may contribute to the mass production of flexible electronic devices.
