Polycapillary X-ray lens for the secondary focusing Beijing synchrotron radiation source

According to intensity distribution of the synchrotron radiation source focused by a toroidal mirror at the Beijing synchrotron radiation biological macromolecule station, theoretical modeling of the Beijing synchrotron radiation source is developed for capillary optics. Using this theoretical modeling, the influences of the configuration curve of the polycapillary X-ray lens on transmission efficiency and working distance are analyzed. The experimental results of the transmission efficiency and working distance at the biological macromolecule station are in good agreement with the theoretical results.

Hard X-ray focusing resolution and efficiency test with a thickness correction multilayer Laue lens

The multilayer Laue lens(MLL) is a diffractive focusing optical element which can focus hard X-rays down to the nanometer scale. In this study, a WSi_(2)/Si multilayer structure consisting of 1736 layers, with a 7.2-nm-thick outermost layer and a total thickness of 17 μm, is prepared by DC magnetron sputtering. Regarding the thin film growth rate calibration, we correct the long-term growth rate drift from 2 to 0.6%, as measured by the grazing incidence X-ray reflectivity(GIXRR). A one-dimensional line focusing resolution of 64 nm was achieved,while the diffraction efficiency was 38% of the-1 order of the MLL Shanghai Synchrotron Radiation Facility(SSRF) with the BL15U beamline.

X-ray focusing using an x-ray lens composed of multi-square polycapillary slices

A new type of x-ray lens composed of multi-square polycapillary slices(ASPXRL)used in focusing parallel x-ray beam was presented in this paper.Compared with conventional x-ray polycapillary lens,ASPXRL can provide smaller and brighter focus.The effects of the manufacturing imperfections on focusing quality of ASPXRL were evaluated with the values of transmission efficiency and discussed.It is suggested that ASPXRL has application prospects as a condenser lens for x-ray microscopy and flux collectors for x-ray analytical instruments.

Focusing high-energy x-rays by a P MMA compound x-ray lens on Beijing synchrotron radiation facility

The x-ray compound lens is a novel refractive x-ray optical device. This paper reports the authors＇ recent research on a polymethyl methacrylate （PMMA） compound x-ray lens. Firstly the designing and LIGA fabrication process for the PMMA compound x-ray lens are briefly described. Then, a method for theoretical analysis, as well as the experimental system for measurement is also introduced. Finally, the focusing spots for 8keV monochromatic x-rays by the PMMA compound x-ray lens are measured and analysed. According to the experimental results, it is concluded that the PMMA compound x-ray lens promises a good focusing performance under the high-energy x-rays.

X-ray nanometer focusing at the SSRF based on a multilayer Laue lens

We designed and fabricated a multilayer Laue lens （MLL） as a hard X-ray focusing device. WSi2/Si multilayers were chosen owing to their excellent optical properties and relatively sharp interface. The multilayer sample was fabricated by using direct current （DC） magnetron sputtering technology and then was sliced and thinned to form an MLL. The thickness of each layer was determined by scanning electron microscopy （SEM） image analysis with marking layers. The focusing property of the MLL was measured at Beamline 15U, Shanghai Synchrotron Facility （SSRF）. One-dimensional （1D） focusing resolutions of 92 nm are obtained at photon energy of 14 keV.

Hard X-ray one dimensional nano-focusing at the SSRF using a WSi_2 /Si multilayer Laue lens

The multilayer Laue lens （MLL） is a novel diffraction optics which can realize nanometer focusing of hard X-rays with high efficiency. In this paper, a 7.9 μm-thick MLL with the outmost layer thickness of 15 nm is designed based on dynamical diffraction theory. The MLL is fabricated by first depositing the depth-graded multilayer using direct current （DC） magnetron sputtering technology. Then, the multilayer sample is sliced, and both cross-sections are thinned and polished to a depth of 35–41 μm. The focusing property of the MLL is measured at the Shanghai Synchrotron Facility （SSRF）. One-dimensional （1D） focusing resolutions of 205 nm and 221 nm are obtained at E=14 keV and 18 keV, respectively. It demonstrates that the fabricated MLL can focus hard X-rays into nanometer scale.

Design and fabrication of one-dimensional focusing X-ray compound lens with A1 material

A method based on Fourier spectrum analysis for predicting the performances of the X-ray compound lenses is briefly introduced, the theoretical result obtained is the same as that of Fresnel-Kirchhoff approach. A kind of technique named moulding is developed for fabricating the one-dimensional (1D) compound X-ray lens with Al material and the fabrication process is presented. In addition, a two-time coating method is used to improve the numerical apertures of the compound lenses. Furthermore, the focusing performance of the Al compound X-ray lens under the high energy X-rays is measured.

Multi-reference lens-less Fourier-transform holography with a Greek-ladder sieve array

Lens-less Fourier-transform holography has been actively studied because of its simple optical structure and its single-shot recording.However,a low-contrast interferogram between the reference and object waves limits its signal to noise ratio.Here,multi-reference lens-less Fourier-transform holography with a Greek-ladder sieve array is proposed in the experiment and demonstrated effectively to improve the signal to noise ratio.The key technique in our proposed method is a Greek-ladder sieve array,which acts as not only a wave-front modulator but also a beam splitter.With advantages of the common path,single shot,and no need for a lens,this system has enormous potential in imaging and especially in extreme ultraviolet and soft X-ray holography.

Experiments and analysis of gold disk targets irradiated by smoothing beams of Xingguang Ⅱ facilities with 350 nm wavelength

Gold disk targets were irradiated using focusing and beam smoothing methods on Xingguang (XG-Ⅱ) laser facilities with 350 nm wavelength,0.6 ns pulse width and 20-80 Joules energies. Laser absorption,light scattering and X-ray conversion were experimentally investigated. The experimental results showed that laser ab-sorption and scattered light were about 90% and 10%,respectively,under focusing irradiation,but the laser absorption increased 5%-10% and the scattered light about 1% under the condition of beam smoothing. Compared with the case of fo-cusing irradiation,the laser absorption was effectively improved and the scattered light remarkably dropped under uniform irradiation; then due to the decrease in laser intensity,X-ray conversion increased. This is highly advantageous to the in-ertial confinement fusion. However,X-ray conversion mechanism basically did not change and X-ray conversion efficiency under beam smoothing and focusing irra-diation was basically the same.

High-energy resolution μ-XRF analysis by position sensitive spectrometer

With a high-energy resolution micro-X-ray fluorescence (μ-XRF) analysis setup, which basically consists of an X-ray microbeam formed by an X-ray focusing lens combined with an X-ray apparatus and a wavelength dispersive position sensitive spectrometer with a flat crystal (PSS), preliminary results have been obtained. The counting rate of the analyzed element linearly increased with the power of X-ray apparatus, and the energy resolution, full width of half maximum (FWHM) of Kα lines of Ti and Cr reached 16.6 and 23.6 eV, respectively. The Cr Kβ and Mn Kα lines in a sample of stainless steel could clearly be resolved. The above-mentioned results are also compared with those obtained by synchrotron radiation light microbeam combined with the PSS. The facts show that the high-energy resolution element analysis is feasible by using the setup. Moreover, problems for the setup and the ways to resolve them are discussed as well.