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Effect of thermal pretreatment of metal precursor on the properties of Cu_2ZnSnS_4 films
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作者 王威 沈鸿烈 +2 位作者 金佳乐 李金泽 马跃 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第5期479-483,共5页
Zn/Sn/Cu (CZT) stacks were prepared by RF magnetron sputtering. The stacks were pretreated at different tem- peratures (200℃, 300 ℃, 350 ℃, and 400 ℃) for 0.5 h and then followed by sulfurization at 500℃ for ... Zn/Sn/Cu (CZT) stacks were prepared by RF magnetron sputtering. The stacks were pretreated at different tem- peratures (200℃, 300 ℃, 350 ℃, and 400 ℃) for 0.5 h and then followed by sulfurization at 500℃ for 2 h. Then, the structures, morphologies, and optical properties of the as-obtained Cu2ZnSnS4 (CZTS) films were studied by x-ray diffraction (XRD), Raman spectroscopy, UV-Vis-NIR, scanning electron microscope (SEM), and energy-dispersive x-ray spectroscopy (EDX). The XRD and Raman spectroscopy results indicated that the sample pretreated at 350℃ had no secondary phase and good crystallization. At the same time, SEM confirmed that it had large and dense grains. According to the UV-Vis-NIR spectrum, the sample had an absorption coefficient larger than 10^4 cm-1 in the visible light range and a band gap close to 1.5 eV. 展开更多
关键词 Cu2ZnSnS4 (CZTS) films radio-frequency magnetron sputtering metal precursor pretreatment
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