Solder interconnects reliability during drop impact is important for portable electronic products. In this paper, board level drop impact tests were conducted according to the standard of the Joint Electronic Devices ...Solder interconnects reliability during drop impact is important for portable electronic products. In this paper, board level drop impact tests were conducted according to the standard of the Joint Electronic Devices Engineering Council (JEDEC). Solder failure drop numbers were recorded and solder failure analyses were carried out. A high speed data acquisition system was constructed to measure the printed cireuit board ( PCt~ ) dynamic response during the impact. Measured response data were used to characterize the loading feature of the impact. The relatioT~~hip between solder failure features and PCB dynamic response was correlated. Solder failure mechanisms were discussed. The correlation of PCB strain data with the solder failure life indicates that the solder damage accumulated during drop impact is dependent on both strain amplitude and modes contribution of the PCB. Compared with high strain amplitude loading condition, lower strain amplitude with higher mode can even produce more severe damage to the solder interconnects. Repeated impact loadings to the solder induce the combination failure mechanism of both impact and fatigue. Failure analyses results provide convincing verification for the complexity of the failure mechanisms.展开更多
在ABAQUS软件中,建立了板级TSOP(thin small outline package)封装跌落/冲击问题的三维有限元模型。采用速度载荷法,研究了PCB(printedcircuitboard)、芯片引脚等的动力学响应,分析了不同支撑条件对仿真结果的影响,并结合板级TSOP封装...在ABAQUS软件中,建立了板级TSOP(thin small outline package)封装跌落/冲击问题的三维有限元模型。采用速度载荷法,研究了PCB(printedcircuitboard)、芯片引脚等的动力学响应,分析了不同支撑条件对仿真结果的影响,并结合板级TSOP封装跌落破坏实验对TSOP封装芯片的焊点失效机理进行了研究。实验结果表明,芯片的惯性力和芯片安装部位PCB的弯曲变形对焊点应力都有较大影响,焊点应力峰值出现在冲击后2ms到3ms之间,这与PCB跌落变形过程中中心部位和碰撞面"二次碰撞"所产生的芯片安装部位弯曲变形密切相关,TSOP封装芯片引脚部位的瞬时拉应力和剪切应力是导致焊点失效的主要原因。展开更多
为提高基于星上ATM(asynchronous transfer mode)交换的宽带卫星通信网络的星上缓存资源的利用率,针对非实时数据业务,提出了一种跨层星上缓存管理策略——错误信元尾丢弃ECTD(erroneouscell tail drop)。该策略把由信道引起的错误信元...为提高基于星上ATM(asynchronous transfer mode)交换的宽带卫星通信网络的星上缓存资源的利用率,针对非实时数据业务,提出了一种跨层星上缓存管理策略——错误信元尾丢弃ECTD(erroneouscell tail drop)。该策略把由信道引起的错误信元及后续的属于同一协议数据单元的无效信元丢弃。基于系统仿真,采用Goodput和有效吞吐量两种性能评估指标分析了ECTD的性能。结果表明,ECTD提高了星上交换机的业务传递效率以及下行链路的利用率,其对有效吞吐量性能的提高大于Goodput性能的提高。展开更多
基金Supported by National Natural Science Foundation of China (No. 51075107 No. 51174069) and Key Project of Natural Science Foundation of Heilongjiang Province (No. ZD200910).
文摘Solder interconnects reliability during drop impact is important for portable electronic products. In this paper, board level drop impact tests were conducted according to the standard of the Joint Electronic Devices Engineering Council (JEDEC). Solder failure drop numbers were recorded and solder failure analyses were carried out. A high speed data acquisition system was constructed to measure the printed cireuit board ( PCt~ ) dynamic response during the impact. Measured response data were used to characterize the loading feature of the impact. The relatioT~~hip between solder failure features and PCB dynamic response was correlated. Solder failure mechanisms were discussed. The correlation of PCB strain data with the solder failure life indicates that the solder damage accumulated during drop impact is dependent on both strain amplitude and modes contribution of the PCB. Compared with high strain amplitude loading condition, lower strain amplitude with higher mode can even produce more severe damage to the solder interconnects. Repeated impact loadings to the solder induce the combination failure mechanism of both impact and fatigue. Failure analyses results provide convincing verification for the complexity of the failure mechanisms.
文摘在ABAQUS软件中,建立了板级TSOP(thin small outline package)封装跌落/冲击问题的三维有限元模型。采用速度载荷法,研究了PCB(printedcircuitboard)、芯片引脚等的动力学响应,分析了不同支撑条件对仿真结果的影响,并结合板级TSOP封装跌落破坏实验对TSOP封装芯片的焊点失效机理进行了研究。实验结果表明,芯片的惯性力和芯片安装部位PCB的弯曲变形对焊点应力都有较大影响,焊点应力峰值出现在冲击后2ms到3ms之间,这与PCB跌落变形过程中中心部位和碰撞面"二次碰撞"所产生的芯片安装部位弯曲变形密切相关,TSOP封装芯片引脚部位的瞬时拉应力和剪切应力是导致焊点失效的主要原因。
文摘为提高基于星上ATM(asynchronous transfer mode)交换的宽带卫星通信网络的星上缓存资源的利用率,针对非实时数据业务,提出了一种跨层星上缓存管理策略——错误信元尾丢弃ECTD(erroneouscell tail drop)。该策略把由信道引起的错误信元及后续的属于同一协议数据单元的无效信元丢弃。基于系统仿真,采用Goodput和有效吞吐量两种性能评估指标分析了ECTD的性能。结果表明,ECTD提高了星上交换机的业务传递效率以及下行链路的利用率,其对有效吞吐量性能的提高大于Goodput性能的提高。