This paper focuses on how to process the information in a discourse and studies the process principles of information.They are Deletion Principle,Generalization Principle,Construction Principle,Fuzzy Parsing Principle...This paper focuses on how to process the information in a discourse and studies the process principles of information.They are Deletion Principle,Generalization Principle,Construction Principle,Fuzzy Parsing Principle.They can be used in the reading comprehension.展开更多
Cerium dioxide, CeO2, is a potentially superior material in a myriad of areas, and many methods have been proposed to deposit single crystal CeO2 thin films. A novel fabrication technique utilizing dual plasma generat...Cerium dioxide, CeO2, is a potentially superior material in a myriad of areas, and many methods have been proposed to deposit single crystal CeO2 thin films. A novel fabrication technique utilizing dual plasma generated by metal vacuum arc (MEVVA) and radio frequency (RF) is discussed in this paper. We have recently conducted a systematic investigation to determine the optimal process window to deposit CeO2 thin films'on Si(100) substrates. The X-ray diffraction results show the existence of CeO2(100) in the as-deposited sample.展开更多
文摘This paper focuses on how to process the information in a discourse and studies the process principles of information.They are Deletion Principle,Generalization Principle,Construction Principle,Fuzzy Parsing Principle.They can be used in the reading comprehension.
基金The work was supported by Hong Kong RGC CERG9040344 and 9040412, RGC / Germany Joint Schemes9050084 and 9050150, and CityU S
文摘Cerium dioxide, CeO2, is a potentially superior material in a myriad of areas, and many methods have been proposed to deposit single crystal CeO2 thin films. A novel fabrication technique utilizing dual plasma generated by metal vacuum arc (MEVVA) and radio frequency (RF) is discussed in this paper. We have recently conducted a systematic investigation to determine the optimal process window to deposit CeO2 thin films'on Si(100) substrates. The X-ray diffraction results show the existence of CeO2(100) in the as-deposited sample.