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Profilometry with Grating Projection Based on One-step Phase Shift 被引量:1
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作者 FAN Yun zheng (School of Physics and Microelectronics, Shandong University, Jinan 250061, CHN) 《Semiconductor Photonics and Technology》 CAS 2001年第3期189-192,共4页
An optical technique for 3 D shape measurement is presented. This technique, based on a deformed projected grating pattern which carries 3 D information of the measured object, can automatically and accurately obtain ... An optical technique for 3 D shape measurement is presented. This technique, based on a deformed projected grating pattern which carries 3 D information of the measured object, can automatically and accurately obtain the phase map of a measured object by using one step phase shift algorithm.In comparison with traditional phase shift technique, the technique is much faster, with the equivalent accuracy. Only one frame image is sufficient for measuring. Experimental result of typical object is presented. 展开更多
关键词 3-D surface contouring Phase shift Profilometry of projected grating
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DEFORMATION MEASUREMENT USING DUAL-FREQUENCY PROJECTION GRATING PHASE-SHIFT PROFILOMETRY 被引量:2
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作者 Yanming Chen Yuming He Eryi Hu Hongmao Zhu 《Acta Mechanica Solida Sinica》 SCIE EI 2008年第2期110-115,共6页
2π phase ambiguity problem is very important in phase measurement when a deformed object has a large out of plane displacement. The dual-frequency projection grating phaseshifting profilometry (PSP) can be used to ... 2π phase ambiguity problem is very important in phase measurement when a deformed object has a large out of plane displacement. The dual-frequency projection grating phaseshifting profilometry (PSP) can be used to solve such an issue. In the measurement, two properchosen frequency gratings are utilized to synthesize an equivalent wavelength grating which ensures the computed phase in a principal phase range. Thus, the error caused by the phase unwrapping process with the conventional phase reconstruct algorithm can be eliminated. Finally, experimental result of a specimen with large plastic deformation is given to prove that the proposed method is effective to handle the phase discontinuity. 展开更多
关键词 dual-frequency phase-shift profilometry projection grating phase unwrapping DEFORMATION
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Automatic Assessment of Fabric Smoothness Grade Using Double CCD Grating Projection
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作者 陈慧敏 张渭源 顾洪波 《Journal of Donghua University(English Edition)》 EI CAS 2007年第5期614-618,共5页
Automatically assessing fabric smoothness grade is very important in the evaluation of fabric appearance.A system for objectively evaluating the fabric smoothness grade based on a grating projection unit and double co... Automatically assessing fabric smoothness grade is very important in the evaluation of fabric appearance.A system for objectively evaluating the fabric smoothness grade based on a grating projection unit and double colored CCD(short form of charge coupled device) was constructed in this paper.Two images captured by different CCD compensated each other which reduced the influence of noises.The application of the four-step phase-shifting method enabled the calculation of the exact phase in a point easy and quick.A large amount of 3D points with three coordinates X,Y and Z were obtained precisely making the definition and calculation of fabric smoothness characters easy.Then four parameters which intuitively denoted the fabric smoothness degree were obtained.Finally,a proper neural network was built,which successfully performed the fabric smoothness classification.The experimental results show that the system is applicable for all the fabric whatever pattern or color.The experimental grades provided by this grating projection system are also highly consistent with the subjective results. 展开更多
关键词 smoothness grade FABRIC grating projection double CCD
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A position sensor based on grating projection with spatial filtering and polarization modulation 被引量:3
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作者 胡建明 曾爱军 王向朝 《Chinese Optics Letters》 SCIE EI CAS CSCD 2006年第1期18-20,共3页
A position sensor based on grating projection with spatial filtering and polarization modulation is presented. A grating is projected onto the object to be measured through a 4f optical system with a spatial filter. A... A position sensor based on grating projection with spatial filtering and polarization modulation is presented. A grating is projected onto the object to be measured through a 4f optical system with a spatial filter. After reflected by the object, the grating projection is imaged on a detection grating through another 4f optical system to form moiré fringes, The polarization modulated moiré signal is detected to obtain the position information of the object. In the position sensor, the moiré signal varies sinusoidally with the position of object. The measurement is independent of the incident intensity on the projection grating and the reflectivity of the object to be measured, In experiments, the effectiveness of the position sensor is proved, and the root mean square (RMS) error at each measurement position is less than 13 nm. 展开更多
关键词 A position sensor based on grating projection with spatial filtering and polarization modulation
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A correction method of color projection fringes in 3D contour measurement 被引量:4
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作者 宋丽梅 李宗艳 +3 位作者 陈昌曼 习江涛 郭庆华 李晓捷 《Optoelectronics Letters》 EI 2015年第4期303-306,共4页
In the three-dimensional(3D) contour measurement,the phase shift profilometry(PSP) method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to im... In the three-dimensional(3D) contour measurement,the phase shift profilometry(PSP) method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this paper.During the measurement,only one color sinusoidal fringe is projected on the measured object.Therefore,the measurement speed is greatly improved.Since there is coupling or interference phenomenon between the adjacent color grating stripes,a color correction method is used to improve the measurement results.A method for correcting nonlinear error of measurement system is proposed in this paper,and the sinusoidal property of acquired image after correction is better than that before correction.Experimental results show that with these correction methods,the measurement errors can be reduced.Therefore,it can support a good foundation for the high-precision 3D reconstruction. 展开更多
关键词 correction contour projection grating correcting projected pixel sinusoidal fringe Tianjin
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