Due to the shortcomings of the diagnosis systems for complex electronic devices such as failure models hard to build and low fault isolation resolution, a new hierarchical modeling and diagnosis method is proposed bas...Due to the shortcomings of the diagnosis systems for complex electronic devices such as failure models hard to build and low fault isolation resolution, a new hierarchical modeling and diagnosis method is proposed based on multisignal model and support vector machine （SVM）. Multisignal model is used to describe the failure propagation relationship in electronic device system, and the most probable failure printed circuit boards （PCBs） can be found by Bayes inference. The exact failure modes in the PCBs can be identified by SVM. The results show the proposed modeling and diagnosis method is effective and suitable for diagnosis for complex electronic devices.展开更多
基金supported by the Defense Foundation Scientific Research Fund under Grant No.9140A17030308DZ02,9140A16060409DZ02the National Natural Science Fundation of Chinaunder Grant No.60934002Dr.Lianke for the extensive discussions on the subject and UESTC for its support under Grant No.JX0756,Y02018023601059
文摘Due to the shortcomings of the diagnosis systems for complex electronic devices such as failure models hard to build and low fault isolation resolution, a new hierarchical modeling and diagnosis method is proposed based on multisignal model and support vector machine （SVM）. Multisignal model is used to describe the failure propagation relationship in electronic device system, and the most probable failure printed circuit boards （PCBs） can be found by Bayes inference. The exact failure modes in the PCBs can be identified by SVM. The results show the proposed modeling and diagnosis method is effective and suitable for diagnosis for complex electronic devices.
