To determine the wall thickness, conductivity and permeability of a ferromagnetic plate, an inverse problem is established with measured values and calculated values of time-domain induced voltage in pulsed eddy curre...To determine the wall thickness, conductivity and permeability of a ferromagnetic plate, an inverse problem is established with measured values and calculated values of time-domain induced voltage in pulsed eddy current testing on the plate. From time-domain analytical expressions of the partial derivatives of induced voltage with respect to parameters,it is deduced that the partial derivatives are approximately linearly dependent. Then the constraints of these parameters are obtained by solving a partial linear differential equation. It is indicated that only the product of conductivity and wall thickness, and the product of relative permeability and wall thickness can be determined accurately through the inverse problem with time-domain induced voltage. In the practical testing, supposing the conductivity of the ferromagnetic plate under test is a fixed value, and then the relative variation of wall thickness between two testing points can be calculated via the ratio of the corresponding inversion results of the product of conductivity and wall thickness. Finally, this method for wall thickness measurement is verified by the experiment results of a carbon steel plate.展开更多
Semiconductor-based electronic devices usually work under multiphysics fields rendering complex electromagnetic-thermo-mechanical coupling.In this work,we develop a penalty function method based on a finite element an...Semiconductor-based electronic devices usually work under multiphysics fields rendering complex electromagnetic-thermo-mechanical coupling.In this work,we develop a penalty function method based on a finite element analysis to tackle this coupling behavior in a metal/semiconductor bilayer plate-the representative unit of semiconductor antenna,which receives strong and pulsed electromagnetic signals.Under these pulses,eddy current is generated,of which the magnitude varies remarkably from one plate to another due to the difference in electrical conductivity.In the concerned system,the metal layer generates much larger current,resulting in the large temperature rise and the nonnegligible Lorentz force,which could lead to delamination and failure of the semiconductor-based electronic device.This study provides theoretical guidance for the design and protection of semiconductor-based electronic devices in complex environments.展开更多
基金supported by the National Defense Basic Technology Research Program of China(Grant No.Z132013T001)
文摘To determine the wall thickness, conductivity and permeability of a ferromagnetic plate, an inverse problem is established with measured values and calculated values of time-domain induced voltage in pulsed eddy current testing on the plate. From time-domain analytical expressions of the partial derivatives of induced voltage with respect to parameters,it is deduced that the partial derivatives are approximately linearly dependent. Then the constraints of these parameters are obtained by solving a partial linear differential equation. It is indicated that only the product of conductivity and wall thickness, and the product of relative permeability and wall thickness can be determined accurately through the inverse problem with time-domain induced voltage. In the practical testing, supposing the conductivity of the ferromagnetic plate under test is a fixed value, and then the relative variation of wall thickness between two testing points can be calculated via the ratio of the corresponding inversion results of the product of conductivity and wall thickness. Finally, this method for wall thickness measurement is verified by the experiment results of a carbon steel plate.
基金the National Natural Science Foundation of China(Grant nos.11772294,11621062)the Fundamental Research Funds for the Central Universities(Grant no.2017QNA4031).
文摘Semiconductor-based electronic devices usually work under multiphysics fields rendering complex electromagnetic-thermo-mechanical coupling.In this work,we develop a penalty function method based on a finite element analysis to tackle this coupling behavior in a metal/semiconductor bilayer plate-the representative unit of semiconductor antenna,which receives strong and pulsed electromagnetic signals.Under these pulses,eddy current is generated,of which the magnitude varies remarkably from one plate to another due to the difference in electrical conductivity.In the concerned system,the metal layer generates much larger current,resulting in the large temperature rise and the nonnegligible Lorentz force,which could lead to delamination and failure of the semiconductor-based electronic device.This study provides theoretical guidance for the design and protection of semiconductor-based electronic devices in complex environments.
