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Corrosion evolution of high-temperature formed oxide film on pure Sn solder substrate 被引量:2
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作者 Hui ZHAO Xu SUN +2 位作者 Long HAO Jian-qiu WANG Jing-mei YANG 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2022年第12期3998-4013,共16页
The evolution of morphology, composition, thickness and corrosion resistance of the oxide film on pure Sn solder substrate submitted to high-temperature aging in 150 °C dry atmosphere was investigated. The result... The evolution of morphology, composition, thickness and corrosion resistance of the oxide film on pure Sn solder substrate submitted to high-temperature aging in 150 °C dry atmosphere was investigated. The results indicate that high-temperature aging accelerates the dehydration of Sn(OH)_(4)in the pre-existing native oxide film to form SnO_(2)and facilitates the oxidation of fresh Sn substrate, resulting in the gradual increase in oxide film thickness and surface roughness with prolonging aging time. However, the corrosion resistance of the film initially is enhanced and then deteriorated with an extending aging time. Besides, the formation and evolution mechanisms of the oxide film with aging time were discussed. 展开更多
关键词 pure sn solder oxide film high-temperature aging corrosion resistance
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Cu_(5)Zn_(8)和Sn/Ag_(3)Sn/Ag扩散阻挡层在Sn/Cu钎焊互连界面反应中的作用
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作者 姚金冶 陈祥序 +3 位作者 李花 马海涛 王云鹏 马浩然 《机械工程学报》 EI CAS CSCD 北大核心 2022年第2期43-49,共7页
电子器件的微型化对钎焊界面的可靠性提出更高的要求,深入研究钎焊界面金属间化合物(Intermetallic compound,IMC)的形貌演变和生长机制具有重要意义。金属Cu具有优良的导电导热性能,在微电子封装行业中广泛应用为基体材料。在钎焊回流... 电子器件的微型化对钎焊界面的可靠性提出更高的要求,深入研究钎焊界面金属间化合物(Intermetallic compound,IMC)的形貌演变和生长机制具有重要意义。金属Cu具有优良的导电导热性能,在微电子封装行业中广泛应用为基体材料。在钎焊回流过程中,Cu基体与Sn钎料发生界面反应生成IMC,由于IMC具有较高脆性,过度生长的IMC会严重降低焊接接头的可靠性。为了抑制IMC的过度生长,在Cu基体表面分别制备Cu_(5)Zn_(8)扩散阻挡层和Sn/Ag_(3)Sn/Ag扩散阻挡层。研究在不同钎焊工艺下,纯Sn钎料在Cu基板、Cu_(5)Zn_(8)扩散阻挡层/Cu基板、Sn/Ag_(3)Sn/Ag扩散阻挡层/Cu基板上IMC的形貌演变及生长动力学机制,最终试验结果发现Cu_(5)Zn_(8),Sn/Ag_(3)Sn/Ag扩散阻挡层可以抑制Sn/Cu钎焊互连界面反应。 展开更多
关键词 扩散阻挡层 钎焊 sn钎料 Cu_(5)Zn_(8) Ag_(3)sn
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