Photoelectron is the foundation of latent image formation, the decay process of photoelectrons is influenced by all kinds of trapping centres in silver halide. By analysing the mechanism of latent image formation it i...Photoelectron is the foundation of latent image formation, the decay process of photoelectrons is influenced by all kinds of trapping centres in silver halide. By analysing the mechanism of latent image formation it is found that electron trap, hole trap, and one kind of recombination centre where free electron and trapped hole recombine are the main trapping centres in silver halide. Different trapping centres have different influences on the photoelectron behaviour. The effects of all kinds of typical trapping centres on the decay of photoelectrons are systematically investigated by solving the photoelectron decay kinetic equations. The results are in agreement with those obtained in the microwave absorption dielectric spectrum experiment.展开更多
On the basis of the ideal gas model, the polarization of charges in the mantle was obtained, a physical and mathematical model was constructed, and estimated calculations of the dipole mode of the Earth’s magnetic fi...On the basis of the ideal gas model, the polarization of charges in the mantle was obtained, a physical and mathematical model was constructed, and estimated calculations of the dipole mode of the Earth’s magnetic field were performed, taking into account the speed of its angular rotation, the parameters of density and temperature, the chemical composition, the ionization potential, the dielectric constant and the percentage of the main chemical compounds of the mantle substance.展开更多
For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field is examined. It is shown that the deformation and the microwave field increase the current through p-n-junction, a...For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field is examined. It is shown that the deformation and the microwave field increase the current through p-n-junction, and the light decreases it. The mechanism of this phenomenon is explained by the fact that under heating of the charge carriers by microwave field the recombination current arises, and under the action of light the generation current arises which are directed oppositely. And under the influence of the deformation the band gap of the semiconductor will be changed.展开更多
We present an extensive study of the electronic properties and carrier transport in phosphorene nanoribbons （PNRs） with edge defects by using rigorous atomistic quantum transport simulations. This study reports on t...We present an extensive study of the electronic properties and carrier transport in phosphorene nanoribbons （PNRs） with edge defects by using rigorous atomistic quantum transport simulations. This study reports on the size- and defect-dependent scaling laws governing the transport gap, and the mean free path and carrier mobility in the PNRs of interest for future nanoelectronics applications. Our results indicate that PNRs with armchair edges （aPNRs） are more immune to defects than zig-zag PNRs （zPNRs）, while both PNR types exhibit superior immunity to defects relative to graphene nanoribbons （GNRs）. An investigation of the mean free path demonstrated that even in the case of a low defect density the transport in PNRs is diffusive, and the carrier mobility remains a meaningful transport parameter even in ultra-small PNRs. We found that the electron-hole mobility asymmetry （present in large-area phosphorene） is retained only in zPNRs for W 〉 4 nrn, while in other cases the asymmetry is smoothed out by edge defect scattering. Furthermore, we showed that aPNRs outperform both zPNRs and GNRs in terms of carrier mobility, and that PNRs generally offer a superior mobility-bandgap trade-off, relative to GNRs and monolayer MoS2. This work identifies PNRs as a promising material for the extremely scaled transistor channels in future posbsilicon electronic technology, and presents a persuasive argument for experimental work on nanostructured phosphorene.展开更多
基金Project supported by the National Natural Science Foundation of China （Grant Nos 10274017 and 10354001）, and the Natural Science Foundation of Hebei Province, China （Grant Nos 103097 and 603138）.
文摘Photoelectron is the foundation of latent image formation, the decay process of photoelectrons is influenced by all kinds of trapping centres in silver halide. By analysing the mechanism of latent image formation it is found that electron trap, hole trap, and one kind of recombination centre where free electron and trapped hole recombine are the main trapping centres in silver halide. Different trapping centres have different influences on the photoelectron behaviour. The effects of all kinds of typical trapping centres on the decay of photoelectrons are systematically investigated by solving the photoelectron decay kinetic equations. The results are in agreement with those obtained in the microwave absorption dielectric spectrum experiment.
文摘On the basis of the ideal gas model, the polarization of charges in the mantle was obtained, a physical and mathematical model was constructed, and estimated calculations of the dipole mode of the Earth’s magnetic field were performed, taking into account the speed of its angular rotation, the parameters of density and temperature, the chemical composition, the ionization potential, the dielectric constant and the percentage of the main chemical compounds of the mantle substance.
文摘For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field is examined. It is shown that the deformation and the microwave field increase the current through p-n-junction, and the light decreases it. The mechanism of this phenomenon is explained by the fact that under heating of the charge carriers by microwave field the recombination current arises, and under the action of light the generation current arises which are directed oppositely. And under the influence of the deformation the band gap of the semiconductor will be changed.
文摘We present an extensive study of the electronic properties and carrier transport in phosphorene nanoribbons （PNRs） with edge defects by using rigorous atomistic quantum transport simulations. This study reports on the size- and defect-dependent scaling laws governing the transport gap, and the mean free path and carrier mobility in the PNRs of interest for future nanoelectronics applications. Our results indicate that PNRs with armchair edges （aPNRs） are more immune to defects than zig-zag PNRs （zPNRs）, while both PNR types exhibit superior immunity to defects relative to graphene nanoribbons （GNRs）. An investigation of the mean free path demonstrated that even in the case of a low defect density the transport in PNRs is diffusive, and the carrier mobility remains a meaningful transport parameter even in ultra-small PNRs. We found that the electron-hole mobility asymmetry （present in large-area phosphorene） is retained only in zPNRs for W 〉 4 nrn, while in other cases the asymmetry is smoothed out by edge defect scattering. Furthermore, we showed that aPNRs outperform both zPNRs and GNRs in terms of carrier mobility, and that PNRs generally offer a superior mobility-bandgap trade-off, relative to GNRs and monolayer MoS2. This work identifies PNRs as a promising material for the extremely scaled transistor channels in future posbsilicon electronic technology, and presents a persuasive argument for experimental work on nanostructured phosphorene.
