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Repeated Strike Process During Disconnector Operation in Ultra-High Voltage Gas-Insulated Switchgear 被引量:1
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作者 关永刚 蔡元纪 +4 位作者 陈维江 刘卫东 李志兵 岳功昌 张俊民 《Plasma Science and Technology》 SCIE EI CAS CSCD 2016年第3期247-253,共7页
Very fast transient over-voltage (VFTO), induced by disconnector operations in gas- insulated switchgears, has become the limiting dielectric stress at ultra-high voltage levels. Much work has been done to investiga... Very fast transient over-voltage (VFTO), induced by disconnector operations in gas- insulated switchgears, has become the limiting dielectric stress at ultra-high voltage levels. Much work has been done to investigate single-strike waveforms of VFTO. However, little study has been carried out investigating the repeated strike process, which would influence VFTO significantly. In this paper, we carried out 450 effective experiments in an ultra-high voltage test circuit, and conducted calculations through the Monte Carlo simulation method, to investigate the repeated strike process. Firstly, the mechanism of the repeated strike process is proposed, based on the ex- perimentai results. Afterwards, statistical breakdown characteristics of disconnectors are obtained and analyzed. Finally, simulations of the repeated strike process are conducted, which indicate that the dielectric strength recovery speed and polarity effect factor have a joint effect on VFTO. This study enhances the understanding of the nature of VFTO, and may help to optimize the disconnector designed to minimize VFTO. 展开更多
关键词 disconnector (DS) repeated strike process DISCHARGE statistical breakdowncharacteristics ultra-high voltage (UHV) very fast transient over-voltage (VFTO)
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Statistical characteristics of transient enclosure voltage in ultra-high-voltage gas-insulated switchgear 被引量:2
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作者 Yuanji CAI Yonggang GUAN Weidong LIU 《Plasma Science and Technology》 SCIE EI CAS CSCD 2017年第6期74-81,共8页
Transient enclosure voltage(TEV),which is a phenomenon induced by the inner dielectric breakdown of SF_6 during disconnector operations in a gas-insulated switchgear(GIS),may cause issues relating to shock hazard ... Transient enclosure voltage(TEV),which is a phenomenon induced by the inner dielectric breakdown of SF_6 during disconnector operations in a gas-insulated switchgear(GIS),may cause issues relating to shock hazard and electromagnetic interference to secondary equipment.This is a critical factor regarding the electromagnetic compatibility of ultra-high-voltage(UHV)substations.In this paper,the statistical characteristics of TEV at UHV level are collected from field experiments,and are analyzed and compared to those from a repeated strike process.The TEV waveforms during disconnector operations are recorded by a self-developed measurement system first.Then,statistical characteristics,such as the pulse number,duration of pulses,frequency components,magnitude and single pulse duration,are extracted.The transmission line theory is introduced to analyze the TEV and is validated by the experimental results.Finally,the relationship between the TEV and the repeated strike process is analyzed.This proves that the pulse voltage of the TEV is proportional to the corresponding breakdown voltage.The results contribute to the definition of the standard testing waveform of the TEV,and can aid the protection of electronic devices in substations by minimizing the threat of this phenomenon. 展开更多
关键词 transient enclosure voltage (TEV) gas-insulated switchgear (GIS) ultra-high-voltage (UHV) repeated strike process DISCONNECTOR
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