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Method of Verification for Manufacturing in Sub-Wavelength Design
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作者 王国雄 严晓浪 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第5期819-823,共5页
We describe a post resolution-enhancement-technique verification method for use in manufacturing data flow. The goal of the method is to verify whether designs function as intended,or more precisely, whether the print... We describe a post resolution-enhancement-technique verification method for use in manufacturing data flow. The goal of the method is to verify whether designs function as intended,or more precisely, whether the printed images are consistent with the design intent. The process modeling is described for the model-based verifi cation method. The performance of the method is demonstrated by experiment. 展开更多
关键词 verification for manufacturing resolution enhancement technique optical proximity correction
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