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Improved Attribute Chain Sampling Plan for Darna Distribution 被引量:1
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作者 Harsh Tripathi Amer Ibrahim Al-Omari +1 位作者 Mahendra Saha Ayed R.A.Alanzi 《Computer Systems Science & Engineering》 SCIE EI 2021年第9期381-392,共12页
Recently,the Darna distribution has been introduced as a new lifetime distribution.The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions.A manufacturer or a... Recently,the Darna distribution has been introduced as a new lifetime distribution.The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions.A manufacturer or an engineer of products conducts life testing to examine whether the quality level of products meets the customer’s requirements,such as reliability or the minimum lifetime.In this article,an attribute modified chain sampling inspection plan based on the time truncated life test is proposed for items whose lifetime follows the Darna distribution.The plan parameters,including the sample size,the acceptance number,and the past lot result of the proposed sampling plan,are determined with the help of the two-point approach considering the acceptable quality level(AQL)and the limiting quality level(LQL).The plan parameters and the corresponding operating characteristic functions of a new plan are provided in tabular form for various Darna distribution parameters.Also,a few illustrated examples are presented for various distribution parameters.The usefulness of the proposed attribute modified chain sampling plan is investigated using two real failure time datasets.The results indicate that the proposed sampling plan can reduce the sample size when the termination ratio increases for fixed values of the producer’s risk and acceptance number.Hence,the proposed attribute modified chain sampling inspection plan is recommended to practitioners in the field. 展开更多
关键词 Attribute chain sampling inspection plan consumer’s risk Darna distribution operating characteristic curve producer’s risk truncated life test
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Simultaneous settings of order quantity,wholesale price,production run length,process mean,and warranty period
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作者 Chung-Ho Chen Chi-Pand Lo Chao-Chin Kan 《Journal of Management Analytics》 EI 2016年第2期174-188,共15页
In this article,the authors propose a modified version of S.L.Chen and Liu’s model with a two-stage production system.Assume that the retailer’s order quantity is concerned with the manufacturer’s selling price and... In this article,the authors propose a modified version of S.L.Chen and Liu’s model with a two-stage production system.Assume that the retailer’s order quantity is concerned with the manufacturer’s selling price and the warranty period of product.The used cost of the customer is measured under the Taguchi’s quadratic quality loss function and concluded in the retailer’s profit function.The quality of the lot for the manufacturer is determined by adopting a two-stage single sampling rectifying inspection plan.The modified economic manufacturing quantity(EMQ)model is addressed in formulating the manufacturer’s expected profit.The retailer’s order quantity,manufacturer’s wholesale price,production run length,process mean,and warranty period of product will be jointly determined by maximizing the total expected profit of the supply chain system including the manufacturer and the retailer.Finally,the quality investment policy is introduced to illustrate the profit improvement for the supply chain system. 展开更多
关键词 production run length warranty period Taguchi’s quadratic quality loss function economic manufacturing quantity model single sampling rectifying inspection plan quality investment
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