Based on a strong inter-diagonal matrix and Taylor series expansions,an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2 ×2 microscan...Based on a strong inter-diagonal matrix and Taylor series expansions,an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2 ×2 microscanning undersampling images from the real irregular undersampling images,and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple,fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.展开更多
针对现有的M通道过采样图滤波器组整体性能较差的问题,该文提出一种过采样图滤波器组设计的新算法。在新算法中,分两步来设计图滤波器组。首先,从频谱特性方面考虑来设计分析滤波器,以分析滤波器的通带波纹和阻带能量为目标函数,以3 d ...针对现有的M通道过采样图滤波器组整体性能较差的问题,该文提出一种过采样图滤波器组设计的新算法。在新算法中,分两步来设计图滤波器组。首先,从频谱特性方面考虑来设计分析滤波器,以分析滤波器的通带波纹和阻带能量为目标函数,以3 d B约束为约束条件,通过半正定规划求解出频谱选择性较好的分析滤波器;然后,从完全重构特性方面考虑来设计综合滤波器,以综合滤波器的阻带能量为目标函数,以完全重构条件为约束函数。上述两个约束优化问题都是半正定规划问题,都可有效地求解。新算法综合考虑了滤波器组的重构特性和频率特性,因此可以设计得到整体性能良好的M通道双正交过采样的图滤波器组。仿真对比表明,与已有的设计算法相比,新算法设计所得的图滤波器组具备更小的重构误差。展开更多
An error correction technique for the micro-scanning instrument of the optical micro-scanning thermal microscope imaging system is proposed. The technique is based on micro-scanning technology combined with the propos...An error correction technique for the micro-scanning instrument of the optical micro-scanning thermal microscope imaging system is proposed. The technique is based on micro-scanning technology combined with the proposed second-order oversampling reconstruction algorithm and local gradient image reconstruction algorithm. In this paper, we describe the local gradient image reconstruction model, the error correction technique, down-sampling model and the error correction principle. In this paper, we use a Lena original image and four low-resolution images obtained from the standard half-pixel displacement to simulate and verify the effectiveness of the proposed technique. In order to verify the effectiveness of the proposed technique, two groups of low-resolution thermal microscope images are collected by the actual thermal microscope imaging system for experimental study. Simulations and experiments show that the proposed technique can reduce the optical micro-scanning errors, improve the imaging effect of the system and improve the system's spatial resolution. It can be applied to other electro-optical imaging systems to improve their resolution.展开更多
Coherent X-ray microscopy has advanced towards higher-energy, more brilliant sources over the past decade since its demonstrations, and many advancements have been made towards optimizing this imaging technique. Here ...Coherent X-ray microscopy has advanced towards higher-energy, more brilliant sources over the past decade since its demonstrations, and many advancements have been made towards optimizing this imaging technique. Here we present both the experimental instrument for obtaining diffraction patterns and the primary reconstruction of yeast cell 2D projection. In addition, the characteristics of the existing optics at BL29XUL of SPring-8 Facility and the method of image reconstruction are discussed.展开更多
基金Supported by the National Natural Science Foundation of China(NSFC 61501396)the Colleges and Universities under the Science and Technology Research Projects of Hebei Province(QN2015021)
文摘Based on a strong inter-diagonal matrix and Taylor series expansions,an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2 ×2 microscanning undersampling images from the real irregular undersampling images,and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple,fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.
文摘针对现有的M通道过采样图滤波器组整体性能较差的问题,该文提出一种过采样图滤波器组设计的新算法。在新算法中,分两步来设计图滤波器组。首先,从频谱特性方面考虑来设计分析滤波器,以分析滤波器的通带波纹和阻带能量为目标函数,以3 d B约束为约束条件,通过半正定规划求解出频谱选择性较好的分析滤波器;然后,从完全重构特性方面考虑来设计综合滤波器,以综合滤波器的阻带能量为目标函数,以完全重构条件为约束函数。上述两个约束优化问题都是半正定规划问题,都可有效地求解。新算法综合考虑了滤波器组的重构特性和频率特性,因此可以设计得到整体性能良好的M通道双正交过采样的图滤波器组。仿真对比表明,与已有的设计算法相比,新算法设计所得的图滤波器组具备更小的重构误差。
基金Supported by Postgraduate Innovation Funding Project of Hebei Province(CXZZSS2019050)the Qinhuangdao City Key Research and Development Program Science and Technology Support Project(201801B010)
文摘An error correction technique for the micro-scanning instrument of the optical micro-scanning thermal microscope imaging system is proposed. The technique is based on micro-scanning technology combined with the proposed second-order oversampling reconstruction algorithm and local gradient image reconstruction algorithm. In this paper, we describe the local gradient image reconstruction model, the error correction technique, down-sampling model and the error correction principle. In this paper, we use a Lena original image and four low-resolution images obtained from the standard half-pixel displacement to simulate and verify the effectiveness of the proposed technique. In order to verify the effectiveness of the proposed technique, two groups of low-resolution thermal microscope images are collected by the actual thermal microscope imaging system for experimental study. Simulations and experiments show that the proposed technique can reduce the optical micro-scanning errors, improve the imaging effect of the system and improve the system's spatial resolution. It can be applied to other electro-optical imaging systems to improve their resolution.
基金Supported by 973 Program of the Ministry of Science and Technology (2009CB918600)
文摘Coherent X-ray microscopy has advanced towards higher-energy, more brilliant sources over the past decade since its demonstrations, and many advancements have been made towards optimizing this imaging technique. Here we present both the experimental instrument for obtaining diffraction patterns and the primary reconstruction of yeast cell 2D projection. In addition, the characteristics of the existing optics at BL29XUL of SPring-8 Facility and the method of image reconstruction are discussed.