The tests on the thermoelectric shock of semiconductor coolers show that the life of semiconductor coolers follows the Weibull distribution. After the early failed devices are removed, the failure rule of the devices ...The tests on the thermoelectric shock of semiconductor coolers show that the life of semiconductor coolers follows the Weibull distribution. After the early failed devices are removed, the failure rule of the devices can be described as an exponential distribution. The main failure mode is tile crack between electric couple material and welding pad. The failure mechanism is the orientated incline and easy splitting of the thermoelectric materials and the stress of substrate deformation due to the temperature difference between the two sides of the cooler. The reliability of the devices can be improved by using multi-layer metalization in electric couple welding.展开更多
A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censore...A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censored test,and figures out the approach to determine the prior distribution of the system failure rate by applying the reliability growth model to incorporate the multistage test data collected from system development.Furthermore,the procedure for the Bayesian sequential testing is derived for the failure rate of the exponential life system,which enables the decision to terminate or continue development test.Finally,a numerical example is given to illustrate the efficiency of the proposed model and procedure.展开更多
为了有效快速评估高可靠性长寿命产品在正常应力条件下的可靠性,提出了一种双应力恒加试验Weibull分布型产品置信可靠性评估模型。首先,采用加速寿命试验(accelerated life test,ALT)技术,建立广义Eyring-Weibull可靠性模型,假定试验各...为了有效快速评估高可靠性长寿命产品在正常应力条件下的可靠性,提出了一种双应力恒加试验Weibull分布型产品置信可靠性评估模型。首先,采用加速寿命试验(accelerated life test,ALT)技术,建立广义Eyring-Weibull可靠性模型,假定试验各应力水平组合下Weibull分布的形状参数相同,且尺度参数与各应力水平组合间呈对数线性关系。其次,给出了Weibull分布定时截尾双应力恒加试验的极大似然估计(maximum likelihood estimation,MLE)方法、与似然函数相关的Fisher信息矩阵以及模型参数的渐近协方差矩阵,构造了模型参数和一些可靠性指标的渐近置信区间。最后,通过仿真算例证明了所提方法的可行性。展开更多
文摘The tests on the thermoelectric shock of semiconductor coolers show that the life of semiconductor coolers follows the Weibull distribution. After the early failed devices are removed, the failure rule of the devices can be described as an exponential distribution. The main failure mode is tile crack between electric couple material and welding pad. The failure mechanism is the orientated incline and easy splitting of the thermoelectric materials and the stress of substrate deformation due to the temperature difference between the two sides of the cooler. The reliability of the devices can be improved by using multi-layer metalization in electric couple welding.
基金supported by the National Natural Science Foundation of China (70571083)the Research Fund for the Doctoral Program of Higher Education of China (20094307110013)
文摘A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censored test,and figures out the approach to determine the prior distribution of the system failure rate by applying the reliability growth model to incorporate the multistage test data collected from system development.Furthermore,the procedure for the Bayesian sequential testing is derived for the failure rate of the exponential life system,which enables the decision to terminate or continue development test.Finally,a numerical example is given to illustrate the efficiency of the proposed model and procedure.
文摘为了有效快速评估高可靠性长寿命产品在正常应力条件下的可靠性,提出了一种双应力恒加试验Weibull分布型产品置信可靠性评估模型。首先,采用加速寿命试验(accelerated life test,ALT)技术,建立广义Eyring-Weibull可靠性模型,假定试验各应力水平组合下Weibull分布的形状参数相同,且尺度参数与各应力水平组合间呈对数线性关系。其次,给出了Weibull分布定时截尾双应力恒加试验的极大似然估计(maximum likelihood estimation,MLE)方法、与似然函数相关的Fisher信息矩阵以及模型参数的渐近协方差矩阵,构造了模型参数和一些可靠性指标的渐近置信区间。最后,通过仿真算例证明了所提方法的可行性。
