Let S be a nonempty, proper subset of all refined inertias. Then, S is called a critical set of refined inertias for ireducible sign patterns of order n if is sufficient for any sign pattern A to be refined inertially...Let S be a nonempty, proper subset of all refined inertias. Then, S is called a critical set of refined inertias for ireducible sign patterns of order n if is sufficient for any sign pattern A to be refined inertially arbitrary. If no proper subset of Sis a critical set of refined inertias, then S is a minimal critical set of refined inertias for sign patterns of order n . In this paper, all minimal critical sets of refined inertias for irreducible sign patterns of order 2 are identified. As a by-product, a new approach is presented to identify all minimal critical sets of inertias for irreducible sign patterns of order 2.展开更多
A sign pattern matrix is a matrix whose entries are from the set {+,-,0}. The symmetric sign pattern matrices that require unique inertia have recently been characterized. The purpose of this paper is to more generall...A sign pattern matrix is a matrix whose entries are from the set {+,-,0}. The symmetric sign pattern matrices that require unique inertia have recently been characterized. The purpose of this paper is to more generally investigate the inertia sets of symmetric sign pattern matrices. In particular, nonnegative tri-diagonal sign patterns and the square sign pattern with all + entries are examined. An algorithm is given for generating nonnegative real symmetric Toeplitz matrices with zero diagonal of orders n≥3 which have exactly two negative eigenvalues. The inertia set of the square pattern with all + off-diagonal entries and zero diagonal entries is then analyzed. The types of inertias which can be in the inertia set of any sign pattern are also obtained in the paper. Specifically, certain compatibility and consecutiveness properties are established.展开更多
For a symmetric sign pattern S1 the inertia set of S is defined to be the set of all ordered triples si（S） = {i（A） ： A = A^T ∈ Q（S）} Consider the n × n sign pattern Sn, where Sn is the pattern with zero e...For a symmetric sign pattern S1 the inertia set of S is defined to be the set of all ordered triples si（S） = {i（A） ： A = A^T ∈ Q（S）} Consider the n × n sign pattern Sn, where Sn is the pattern with zero entry （i,j） for 1 ≤ i = j ≤ n or｜i -j｜=n- 1 and positive entry otherwise. In this paper, it is proved that si（Sn） = {（n1, n2, n - n1 - n2）｜n1≥ 1 and n2 ≥ 2} for n ≥ 4.展开更多
Fault diagnosis of various systems on rolling stock has drawn the attention of many researchers. However, obtaining an optimized sensor set of these systems, which is a prerequisite for fault diagnosis, remains a majo...Fault diagnosis of various systems on rolling stock has drawn the attention of many researchers. However, obtaining an optimized sensor set of these systems, which is a prerequisite for fault diagnosis, remains a major challenge. Available literature suggests that the configuration of sensors in these systems is presently dependent on the knowledge and engineering experiences of designers, which may lead to insufficient or redundant development of various sensors. In this paper, the optimization of sensor sets is addressed by using the signed digraph （SDG） method. The method is modified for use in braking systems by the introduction of an effect-function method to replace the traditional quantitative methods. Two criteria are adopted to evaluate the capability of the sensor sets, namely, observability and resolution. The sensors configuration method of braking system is proposed. It consists of generating bipartite graphs from SDG models and then solving the set cover problem using a greedy algorithm. To demonstrate the improvement, the sensor configuration of the HP2008 braking system is investigated and fault diagnosis on a test bench is performed. The test results show that SDG algorithm can improve single-fault resolution from 6 faults to 10 faults, and with additional four brake cylinder pressure （BCP） sensors it can cover up to 67 double faults which were not considered by traditional fault diagnosis system. SDG methods are suitable for reducing redundant sensors and that the sensor sets thereby obtained are capable of detecting typical faults, such as the failure of a release valve. This study investigates the formal extension of the SDG method to the sensor configuration of braking system, as well as the adaptation supported by the effect-function method.展开更多
Short time existence and uniqueness for the classical motion are studied by the function of the principal curvatures of a smooth surface and the Evans and Spruck's results are generalized.
In this paper, we study the following quasilinear equation of choquard type: where A(x,t) is given real functions on R<sup>N</sup> × R and with N ≥ 3, 1 p N, max{N-2p,1} α N, , and ε > 0 is a sm...In this paper, we study the following quasilinear equation of choquard type: where A(x,t) is given real functions on R<sup>N</sup> × R and with N ≥ 3, 1 p N, max{N-2p,1} α N, , and ε > 0 is a small parameter, I<sub>α</sub> is the Riesz potential. We establish for small ε the existence of a sequence of sign-changing solutions concentrating near a given local minimum point of the bounded potential function V by using the method of invariant sets of descending flow, perturbation method and truncation technique. .展开更多
文摘Let S be a nonempty, proper subset of all refined inertias. Then, S is called a critical set of refined inertias for ireducible sign patterns of order n if is sufficient for any sign pattern A to be refined inertially arbitrary. If no proper subset of Sis a critical set of refined inertias, then S is a minimal critical set of refined inertias for sign patterns of order n . In this paper, all minimal critical sets of refined inertias for irreducible sign patterns of order 2 are identified. As a by-product, a new approach is presented to identify all minimal critical sets of inertias for irreducible sign patterns of order 2.
文摘A sign pattern matrix is a matrix whose entries are from the set {+,-,0}. The symmetric sign pattern matrices that require unique inertia have recently been characterized. The purpose of this paper is to more generally investigate the inertia sets of symmetric sign pattern matrices. In particular, nonnegative tri-diagonal sign patterns and the square sign pattern with all + entries are examined. An algorithm is given for generating nonnegative real symmetric Toeplitz matrices with zero diagonal of orders n≥3 which have exactly two negative eigenvalues. The inertia set of the square pattern with all + off-diagonal entries and zero diagonal entries is then analyzed. The types of inertias which can be in the inertia set of any sign pattern are also obtained in the paper. Specifically, certain compatibility and consecutiveness properties are established.
基金The NSF(10871188)of Chinathe NSF(KB2007030)of Jiangsu Provincethe NSF(07KJD110702)of University In Jiangsu Province.
文摘For a symmetric sign pattern S1 the inertia set of S is defined to be the set of all ordered triples si（S） = {i（A） ： A = A^T ∈ Q（S）} Consider the n × n sign pattern Sn, where Sn is the pattern with zero entry （i,j） for 1 ≤ i = j ≤ n or｜i -j｜=n- 1 and positive entry otherwise. In this paper, it is proved that si（Sn） = {（n1, n2, n - n1 - n2）｜n1≥ 1 and n2 ≥ 2} for n ≥ 4.
基金Supported by National Hi-tech Research and Development Program of China(863 Program,Grant No.2011AA110503-3)Fundamental Research Funds for the Central Universities of China(Grant No.2860219030)Foundation of Traction Power State Key Laboratory of Southwest Jiaotong University,China(Grant No.TPL1308)
文摘Fault diagnosis of various systems on rolling stock has drawn the attention of many researchers. However, obtaining an optimized sensor set of these systems, which is a prerequisite for fault diagnosis, remains a major challenge. Available literature suggests that the configuration of sensors in these systems is presently dependent on the knowledge and engineering experiences of designers, which may lead to insufficient or redundant development of various sensors. In this paper, the optimization of sensor sets is addressed by using the signed digraph （SDG） method. The method is modified for use in braking systems by the introduction of an effect-function method to replace the traditional quantitative methods. Two criteria are adopted to evaluate the capability of the sensor sets, namely, observability and resolution. The sensors configuration method of braking system is proposed. It consists of generating bipartite graphs from SDG models and then solving the set cover problem using a greedy algorithm. To demonstrate the improvement, the sensor configuration of the HP2008 braking system is investigated and fault diagnosis on a test bench is performed. The test results show that SDG algorithm can improve single-fault resolution from 6 faults to 10 faults, and with additional four brake cylinder pressure （BCP） sensors it can cover up to 67 double faults which were not considered by traditional fault diagnosis system. SDG methods are suitable for reducing redundant sensors and that the sensor sets thereby obtained are capable of detecting typical faults, such as the failure of a release valve. This study investigates the formal extension of the SDG method to the sensor configuration of braking system, as well as the adaptation supported by the effect-function method.
文摘Short time existence and uniqueness for the classical motion are studied by the function of the principal curvatures of a smooth surface and the Evans and Spruck's results are generalized.
文摘In this paper, we study the following quasilinear equation of choquard type: where A(x,t) is given real functions on R<sup>N</sup> × R and with N ≥ 3, 1 p N, max{N-2p,1} α N, , and ε > 0 is a small parameter, I<sub>α</sub> is the Riesz potential. We establish for small ε the existence of a sequence of sign-changing solutions concentrating near a given local minimum point of the bounded potential function V by using the method of invariant sets of descending flow, perturbation method and truncation technique. .
