Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Si...Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.展开更多
The single event effect(SEE) is an important consideration in electronic devices used in space environments because it can lead to spacecraft anomalies and failures. The linear energy transfer(LET) of ions is commonly...The single event effect(SEE) is an important consideration in electronic devices used in space environments because it can lead to spacecraft anomalies and failures. The linear energy transfer(LET) of ions is commonly investigated in studies of SEE. The use of a thin detector is an economical way of directly measuring the LET in space. An LET telescope consists of a thin detector as the front detector(D1), along with a back detector that indicates whether D1 was penetrated. The particle radiation effect monitor(PREM) introduced in this paper is designed to categorize the LET into four bins of 0.2–0.4, 0.4–1.0, 1.0–2.0 and 2.0–20 Me V·cm^2/mg, and one integral bin of LET>20 Me V·cm^2/mg. After calibration with heavy ions and Geant4 analysis, the LET boundaries of the first four bins are determined to be 0.236, 0.479, 1.196, 2.254, and 17.551 Me V·cm^2/mg, whereas that of the integral bin is determined to be LET>14.790 Me V·cm^2/mg. The acceptances are calculated by Geant4 analysis as 0.452, 0.451, 0.476, 0.446, and 1.334, respectively. The LET accuracy is shown to depend on the thickness of D1; as D1 is made thinner, the accuracy of the measured values increases.展开更多
文摘Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.
基金supported by the National Natural Science Foundation of China(Grant No.41374181)the National Key Scientific Instrument and Equipment Development ProjectsChina(Grant No.2012YQ03014207)
文摘The single event effect(SEE) is an important consideration in electronic devices used in space environments because it can lead to spacecraft anomalies and failures. The linear energy transfer(LET) of ions is commonly investigated in studies of SEE. The use of a thin detector is an economical way of directly measuring the LET in space. An LET telescope consists of a thin detector as the front detector(D1), along with a back detector that indicates whether D1 was penetrated. The particle radiation effect monitor(PREM) introduced in this paper is designed to categorize the LET into four bins of 0.2–0.4, 0.4–1.0, 1.0–2.0 and 2.0–20 Me V·cm^2/mg, and one integral bin of LET>20 Me V·cm^2/mg. After calibration with heavy ions and Geant4 analysis, the LET boundaries of the first four bins are determined to be 0.236, 0.479, 1.196, 2.254, and 17.551 Me V·cm^2/mg, whereas that of the integral bin is determined to be LET>14.790 Me V·cm^2/mg. The acceptances are calculated by Geant4 analysis as 0.452, 0.451, 0.476, 0.446, and 1.334, respectively. The LET accuracy is shown to depend on the thickness of D1; as D1 is made thinner, the accuracy of the measured values increases.
