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A novel optical burst switching architecture for high speed networks 被引量:2
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作者 Amit Kumar Garg R.S.Kaler 《Chinese Optics Letters》 SCIE EI CAS CSCD 2008年第11期807-811,共5页
A novel optical burst switching (OBS) high speed network architecture has been proposed. To verify its feasibility and evaluate its performance, just-enough-time (JET) signaling has been considered as a high perfo... A novel optical burst switching (OBS) high speed network architecture has been proposed. To verify its feasibility and evaluate its performance, just-enough-time (JET) signaling has been considered as a high performance protocol. In the proposed architecture, to avoid burst losses, firstly, a short-prior- confirmation-packet (SPCP) is sent over the control channel that simulates the events that the actual packet will experience. Once SPCP detects a drop at any of the intermediate nodes, the actual packet is not sent but the process repeats. In order to increase network utilization, cost effectiveness and to overcome some limitations of conventional OBS, inherent codes (e.g., orthogonal optical codes (OOC)), which are codified only in intensity, has been used. Through simulations, it shows that a decrease in burst loss probability, cost effectiveness and a gain in processing time are obtained when optical label processing is used as compared with electronic processing. 展开更多
关键词 NODE OBS A novel optical burst switching architecture for high speed networks LENGTH HIGH
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Influence of electron irradiation on the switching speed in insulated gate bipolar transistors
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作者 卢烁今 王立新 +2 位作者 陆江 刘刚 韩郑生 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第6期76-78,共3页
The influence of electron irradiation on the switching speed in insulated gate bipolar transistors(IGBT) with different epitaxial layer thicknesses is discussed in detail.The experimental results prove that the fall... The influence of electron irradiation on the switching speed in insulated gate bipolar transistors(IGBT) with different epitaxial layer thicknesses is discussed in detail.The experimental results prove that the fall time of IGBT increases when increasing the thickness of the epitaxial layer.However,there is no obvious difference between the ratios of the fall time after irradiation to those before irradiation for different epitaxial layer thicknesses.The increase in switching speed of the IGBT is accompanied by an increase in the forward drop,and a trade-off curve between forward voltage drop and fall time of IGBT is presented. 展开更多
关键词 electron irradiation fall time switching speed IGBT
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Double gate lateral IGBT on partial membrane
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作者 罗小蓉 雷磊 +2 位作者 张伟 张波 李肇基 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第2期7-10,共4页
A new SOILIGBT(lateral insulated-gate bipolar transistor) with cathode-and anode-gates on partial membrane is proposed.A low on-state resistance is achieved when a negative voltage is applied to the anode gate.In th... A new SOILIGBT(lateral insulated-gate bipolar transistor) with cathode-and anode-gates on partial membrane is proposed.A low on-state resistance is achieved when a negative voltage is applied to the anode gate.In the blocking state,the cathode gate is shortened to the cathode and the anode gate is shortened to the anode,leading to a fast switching speed.Moreover,the removal of the partial silicon substrate under the drift region avoids collecting charges beneath the buried oxide,which releases potential lines below the membrane,yielding an enhanced breakdown voltage(BV).Furthermore,a high switching speed is obtained due to the absence of the drain-substrate capacitance. Lastly,a combination of uniformity and variation in lateral doping profiles helps to achieve a high BV and low special on-resistance.Compared with a conventional LIGBT,the proposed structure exhibits high current capability,low special on-resistance,and double the BV. 展开更多
关键词 SOI LIGBT ON-RESISTANCE breakdown voltage switching speed
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