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TXV Technology:The cornerstone of 3D system-in-packaging 被引量:3
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作者 ZHAO HeRan CHEN MingXiang +3 位作者 PENG Yang WANG Qing KANG Min CAO LiHua 《Science China(Technological Sciences)》 SCIE EI CAS CSCD 2022年第9期2031-2050,共20页
System-in-packaging(Si P) can realize the integration and miniaturization of electronic devices and it is significant to continue Moore’s law.Through-X-via(TXV) technology is the cornerstone of 3 D-SiP,which enables ... System-in-packaging(Si P) can realize the integration and miniaturization of electronic devices and it is significant to continue Moore’s law.Through-X-via(TXV) technology is the cornerstone of 3 D-SiP,which enables the vertical stacking and electrical interconnection of electronic devices.TXV originated from through-hole(TH) in PCB substrates and evolved in different substrate materials,such as silicon,glass,ceramic,and polymer.This work provides a comprehensive review of four distinguishing TXV technologies(through silicon via(TSV),through glass via(TGV),through ceramic via(TCV),and through mold via(TMV)),including the fabrication mechanisms,processes,and applications.Every TXV technology has unique characteristics and owns particular processes and functions.The process methods,key technologies,application fields,and advantages and disadvantages of each TXV technology were discussed.The cutting-edge through-hole process and development direction were reviewed. 展开更多
关键词 through silicon via(TSV) through ceramic via(TCV) through glass via(TGV) through mold via(TMV) 3D packaging chip stacking interposer
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