Stress Field of Straight Edge Dislocation in Magnetic Field

To study the changes in mechanical properties of materials within magnetic fields and the motion of dislocations, stress fields of dislocation in magnetic field need to be calculated. The straight edge dislocation is of basic importance in various defects . The stress field of straight edge dislocation in an external static magnetic field is determined by the theory of elasticity and electrodynamics according to the Volterra dislocation model for continuous media. This reduces to the known stress field when the magnet field is zero. The results can be used for further study on the strain energy of dislocations and the interactions between dislocations in magnetic fields.

A New Edge-directed Subpixel Edge Localization Method

Localization of the inspected chip image is one of the key problems with machine vision aided surface mount devices (SMD) and other micro-electronic equipments. This paper presents a new edge-directed subpixel edge localization method. The image is divided into two regions, edge and non-edge, using edge detection to emphasize the edge feature. Since the edges of the chip image are straight, they have straight-line characteristics locally and globally. First, the line segments of the straight edge are located to subpixel precision, according to their local straight properties, in a 3×3 neighborhood of the edge region. Second, the subpixel midpoints of the line segments are computed. Finally, the straight edge is fitted using the midpoints and the least square method, according to its global straight property in the entire edge region. In this way, the edge is located to subpixel precision. While fitting the edge, the irregular points are eliminated by the angles of the line segments to improve the precision. We can also distinguish different edges and their intersections using the angles of the line segments and distances between the edge points, then give the vectorial result of the image edge with high precision.