期刊文献+
共找到3篇文章
< 1 >
每页显示 20 50 100
Measuring In-Plane Micro-Motion of Micro-Structure Using Optical Flow 被引量:1
1
作者 金翠云 靳世久 +1 位作者 栗大超 王建林 《Transactions of Tianjin University》 EI CAS 2009年第1期19-22,共4页
Optical flow method is one of the most important methods of analyzing motion images. Optical flow field is used to analyze characteristics of motion objects. According to motion features of micro-electronic mechani-ca... Optical flow method is one of the most important methods of analyzing motion images. Optical flow field is used to analyze characteristics of motion objects. According to motion features of micro-electronic mechani-cal system (MEMS) micro-structure, the optical algorithm based on label field and neighborhood optimization is presented to analyze the in-plane micro-motion of micro-structure. Firstly, high speed motion states for each fre-quency segment of micro-structure in cyclic motion are frozen based on stroboscopic principle. Thus a series of dynamic images of micro-structure are obtained. Secondly, the presented optical algorithm is used to analyze the image sequences, and can obtain reliable and precise optical field and reduce computing time. As micro-resonator of testing object, the phase-amplitude curve of micro-structure is derived. Experimental results indicate that the meas-urement precision of the presented algorithm is high, and measurement repeatability reaches 40 nm under the same experiment condition. 展开更多
关键词 micro-electronic mechanical system (MEMS) MICRO-MOTION stroboscopic imaging optical flow label field
下载PDF
Optical Measurement System for Motion Characterization of Surface Mount Technology 被引量:1
2
作者 LI Song AN Bing +1 位作者 ZHANG Tong-jun XIE Yong-jun 《Semiconductor Photonics and Technology》 CAS 2006年第3期173-177,210,共6页
Advanced testing methods for the dynamics of mechanical microdevices are necessary to develop reliable, marketable microelectromechanical systems. A system for measuring the nanometer motions of microscopic structures... Advanced testing methods for the dynamics of mechanical microdevices are necessary to develop reliable, marketable microelectromechanical systems. A system for measuring the nanometer motions of microscopic structures has been demonstrated. Stop-action images of a target have been obtained with computer microvision, microscopic interferometry, and stroboscopic illuminator. It can be developed for measuring the in-plane-rigid-body motions, surface shapes, out-of-plane motions and deformations of microstructures. A new algorithm of sub-pixel step length correlation template matching is proposed to extract the in-plane displacement from vision images. Hariharan five-step phase-shift interferometry algorithm and unwrapping algorithms are adopted to measure the out-of-plane motions. It is demonstrated that the system can measure the motions of solder wetting in surface mount technology(SMT). 展开更多
关键词 INTERFEROMETRY stroboscopic imaging Computer microvision Dynamic measurement MEMS reliability Solder wetting
下载PDF
MEMS Test System Based on Virtual Instrument Technology
3
作者 胡晓东 栗大超 +2 位作者 郭彤 胡春光 胡小唐 《Transactions of Tianjin University》 EI CAS 2007年第2期88-92,共5页
On account of the multiformity of MEMS devices, it is necessary to integrate with some optical measurement techniques for meeting static and dynamic unit test requirements. In this paper, an automated MEMS test system... On account of the multiformity of MEMS devices, it is necessary to integrate with some optical measurement techniques for meeting static and dynamic unit test requirements. In this paper, an automated MEMS test system is built of some commercially available components and instruments based on virtual instrument technology. The system is integrated with stroboscopic imaging, computer micro-vision, microscopic Mirau phase shifting interferometry, and laser Doppler vibrometer, and is used for the measurement of full-view in-plane and out-of-plane geometric parameters and periodical motions and single spot out-of-plane transient motion. The system configuration and measurement methods are analyzed, and some applications of the measurement of in-plane and out-of-plane dimensions and motions were described. The measurement accuracy of in-plane dimensions and out-of-plane dimensional is better than 0.2 um and 5 nm respectively. The resolution of measuring in-plane and out-of-plane motions is better than 15 nm and 2 nm respectively. 展开更多
关键词 MEMS optical measurement technique stroboscopic imaging virtual instrument dynamic test
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部