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Subwavelength-resolution direct writing using submicron-diameter fibers 被引量:1
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作者 田丰 杨国光 +4 位作者 白剑 周巧芬 侯昌伦 徐建锋 梁宜勇 《Chinese Optics Letters》 SCIE EI CAS CSCD 2010年第3期326-328,共3页
A novel direct writing technique using submicron-diameter fibers is presented. This technique adopts contact mode in the process of writing, and submicron lines with different widths have been obtained. Experimental r... A novel direct writing technique using submicron-diameter fibers is presented. This technique adopts contact mode in the process of writing, and submicron lines with different widths have been obtained. Experimental results demonstrate that the resolution of this technique can be smaller than the exposure wavelength of 442 nm, and 380-nm-wide line is achieved. In addition, the distribution of light fields in the photoresist layer is analyzed by finite-difference time-domain method. 展开更多
关键词 line Subwavelength-resolution direct writing using submicron-diameter fibers Figure FDTD AFM
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