A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface ...A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface roughness of Mo/Si multilayers were determined by small angle X-ray diffraction （SAXRD）. Surface roughness change curve of Mo/Si multilayer with increasing layer number was studied by atomic force microscope （AFM）. Soft X-ray reflectivity of Mo/Si multilayers was measured in National Synchrotron Radiation Laboratory （NSRL）. Theoretical and experimental results show that the soft X-ray reflectivity of Mo/Si multilayer is mainly determined by periodic number and interface roughness, surface roughness has little effect on reflectivity.展开更多
Satisfactory single crystals of deshexapeptide(B25—B30) insulin for X-ray crystal structure analysis have been grown in citrate buffer by the method of hanging-drop gas phase diffusion. The crystal belongs to the mon...Satisfactory single crystals of deshexapeptide(B25—B30) insulin for X-ray crystal structure analysis have been grown in citrate buffer by the method of hanging-drop gas phase diffusion. The crystal belongs to the monoclinic system with space group C2. The unit cell constants are α=42.6, b=37.9, c=27.2, β=125.4 and there is only one molecule of deshexapeptide insulin in an asymmetric unit.展开更多
文摘A series of Mo/Si multilayers with the same periodic length and different periodic number were prepared by magnetron sputtering, whose top layers were respectively Mo layer and Si layer. Periodic length and interface roughness of Mo/Si multilayers were determined by small angle X-ray diffraction （SAXRD）. Surface roughness change curve of Mo/Si multilayer with increasing layer number was studied by atomic force microscope （AFM）. Soft X-ray reflectivity of Mo/Si multilayers was measured in National Synchrotron Radiation Laboratory （NSRL）. Theoretical and experimental results show that the soft X-ray reflectivity of Mo/Si multilayer is mainly determined by periodic number and interface roughness, surface roughness has little effect on reflectivity.
基金Project supported by the National Natural Science Foundation of China.
文摘Satisfactory single crystals of deshexapeptide(B25—B30) insulin for X-ray crystal structure analysis have been grown in citrate buffer by the method of hanging-drop gas phase diffusion. The crystal belongs to the monoclinic system with space group C2. The unit cell constants are α=42.6, b=37.9, c=27.2, β=125.4 and there is only one molecule of deshexapeptide insulin in an asymmetric unit.
