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Theory of higher harmonics imaging in tapping-mode atomic force microscopy 被引量:1
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作者 李渊 钱建强 李英姿 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第5期213-218,共6页
The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full char... The periodic impact force induced by tip-sample contact in a tapping mode atomic force microscope (AFM) gives rise to the non-harmonic response of a micro-cantilever. These non-harmonic signals contain the full characteristics of tip-sample interaction. A complete theoretical model describing the dynamical behaviour of tip-sample system was developed in this paper. An analytic formula was introduced to describe the relationship between time-varying tip-sample impact force and tip motion. The theoretical analysis and numerical results both show that the timevarying tip-sample impact force can be reconstructed by recording tip motion. This allows for the reconstruction of the characteristics of the tip-sample force, like contact time and maximum contact force. It can also explain the ability of AFM higher harmonics imaging in mapping stiffness and surface energy variations. 展开更多
关键词 tapping mode atomic force microscopy higher harmonics imaging
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