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烧结温度对Fe-Ni-Mo磁温度补偿合金热磁性能的影响 被引量:1
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作者 何东升 李平 曲选辉 《粉末冶金技术》 EI CAS CSCD 北大核心 2008年第1期7-10,14,共5页
采用粉末冶金法制备Fe-Ni-Mo磁温度补偿合金,研究了烧结温度对试样相结构和热磁性能的影响。对不同烧结温度试样X射线衍射(XRD)分析发现:1100℃与1150℃烧结产物均为γ(Fe,Ni)与体心立方Mo;1200℃为γ(Fe,Ni)、α(Fe,Ni)与体心立方Mo;1... 采用粉末冶金法制备Fe-Ni-Mo磁温度补偿合金,研究了烧结温度对试样相结构和热磁性能的影响。对不同烧结温度试样X射线衍射(XRD)分析发现:1100℃与1150℃烧结产物均为γ(Fe,Ni)与体心立方Mo;1200℃为γ(Fe,Ni)、α(Fe,Ni)与体心立方Mo;1250℃烧结产物分别为γ(Fe,Ni)、α(Fe,Ni)、体心立方Mo与面心立方Mo四相;1300℃烧结产物为γ(Fe,Ni)、α(Fe,Ni)与面心立方Mo。从衍射峰相对强度变化可知:烧结产物α(Fe,Ni)含量随烧结温度先增后减,1250℃烧结α(Fe,Ni)含量最高。通过磁性测量与电镜分析可知,粉末冶金法制备磁温度补偿合金的关键是烧结温度。通过粉末冶金法与铸造法制得的试样热磁性能对比可知:粉末冶金法试样的热磁性略低于铸造试样的,但其热磁性能的稳定性得到很大提高。 展开更多
关键词 磁温度补偿合金 外补偿法 温度系数 粉末冶金
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A New CMOS Current Reference with High Order Temperature Compensation
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作者 周号 张波 +1 位作者 李肇基 罗萍 《Journal of Electronic Science and Technology of China》 2006年第1期8-11,共4页
A new high order CMOS temperature compensated current reference is proposed in this paper, which is accomplished by two first order temperature compensation current references. The novel circuit exploits the temperatu... A new high order CMOS temperature compensated current reference is proposed in this paper, which is accomplished by two first order temperature compensation current references. The novel circuit exploits the temperature characteristics of integrated-circuit resistors and gate-source voltage of MOS transistors working in weak inversion. The proposed circuit, designed with a 0.6 Izm standard CMOS technology, gives a good temperature coefficient of 31ppm/℃ [-50-100℃] at a 1.8V supply, and also achieves line regulation of 0.01%/V and-120dB PSR at 1 MHz. Comparing with other presented work, the proposed circuit shows better temperature coefficient and Line regulation. 展开更多
关键词 current reference temperature-compensation weak inversion poly resistor
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A cryogenic SAR ADC for infrared readout circuits 被引量:3
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作者 赵宏亮 赵毅强 张之圣 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第11期152-156,共5页
comparatorAbstract: A cryogenic successive approximation register (SAR) analog to digital converter (ADC) is presented. It has been designed to operate in cryogenic infrared readout systems as they are cooled fro... comparatorAbstract: A cryogenic successive approximation register (SAR) analog to digital converter (ADC) is presented. It has been designed to operate in cryogenic infrared readout systems as they are cooled from room temperature to their final cryogenic operation temperature. In order to preserve the circuit's performance over this wide temperature range, a temperature-compensated time-based comparator architecture is used in the ADC, which provides a steady performance with ultra low power for extreme temperature (from room temperature down to 77 K) operation. The converter implemented in a standard 0.35 μm CMOS process exhibits 0.64 LSB maximum differential nonlinearity (DNL) and 0.59 LSB maximum integral nonlinearity (1NL). It achieves 9.3 bit effective number of bits (ENOB) with 200 kS/s sampling rate at 77 K, dissipating 0.23 mW under 3.3 V supply voltage and occupies 0.8 × 0.3 mm^2. 展开更多
关键词 cryogenic ADC low power successive approximation register temperature-compensated time-based
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Compact trimming design of a high-precision reference
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作者 任国栋 赵世芳 +1 位作者 蒲忠胜 魏智强 《Journal of Semiconductors》 EI CAS CSCD 2014年第4期134-137,共4页
To design a high-precision reference, the various error sources have been analyzed and compensated with a compact 111 mV resistor-trim scheme and the upper and lower extremes of the reference precision are also temper... To design a high-precision reference, the various error sources have been analyzed and compensated with a compact 111 mV resistor-trim scheme and the upper and lower extremes of the reference precision are also temperature-compensated. At room temperature, the yield of :50.5% precision is 96% and :50.2% is 78%. 展开更多
关键词 HIGH-PRECISION error sources TRIM temperature-compensated
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