期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
SABATPG-A Structural Analysis Based Automatic Test Generation System
1
作者 李忠诚 潘榆奇 闵应骅 《Science China Mathematics》 SCIE 1994年第9期1104-1114,共11页
A TPG system, SABATPG, is given based on a generic structural model of large circuits. Three techniques of partial implication, aftereffect of identified undetectable faults and shared sensitization with new concepts ... A TPG system, SABATPG, is given based on a generic structural model of large circuits. Three techniques of partial implication, aftereffect of identified undetectable faults and shared sensitization with new concepts of localization and aftereffect are employed in the system to improve FAN algorithm. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% less than that of FAN algorithm. 展开更多
关键词 test generation sensitization implication undetectable fault
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部