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Researches of DC-Problem Under the Model S in which the Numbers of Defective Coins are not Fixed
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作者 丁承杰 刘文安 《Chinese Quarterly Journal of Mathematics》 CSCD 1992年第4期106-110,共5页
In this paper,we research general Defective Cion Problem under the model S,i.e,the number d of Defective cions is not fixed. For d=O,1,or 2. we get some good results.
关键词 model S test set optimal test scheme
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