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Software Testing Method Based on Model Comparison
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作者 谢晓东 卢炎生 毛澄印 《Journal of Southwest Jiaotong University(English Edition)》 2008年第2期99-108,共10页
A model comparison based software testing method (MCST) is proposed. In this method, the requirements aria programs or software under test are transformed into the ones in the same form, and described by the same mo... A model comparison based software testing method (MCST) is proposed. In this method, the requirements aria programs or software under test are transformed into the ones in the same form, and described by the same model describe language (MDL). Then, the requirements are transformed into a specification model and the programs into an implementation model. Thus, the elements and structures of the two models are compared, and the differences between them are obtained. Based on the diffrences, a test suite is generated. Different MDLs can be chosen for the software under test. The usages of two classical MDLs in MCST, the equivalence classes model and the extended finite state machine (EFSM) model, are described with example applications. The results show that the test suites generated by MCST are more efficient and smaller than some other testing methods, such as the pathcoverage testing method, the object state diagram testing method, etc. 展开更多
关键词 Software testing test suite generation Model comparison
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Balancing Frequencies and Fault Detection in the In-Parameter-Order Algorithm
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作者 高世伟 吕江花 +2 位作者 杜冰磊 Charles J. Colbourn 马世龙 《Journal of Computer Science & Technology》 SCIE EI CSCD 2015年第5期957-968,共12页
The In-Parameter-Order (IPO) algorithm is a widely used strategy for the construction of software test suites for combinatorial testing (CT) whose goal is to reveal faults triggered by interactions among parameter... The In-Parameter-Order (IPO) algorithm is a widely used strategy for the construction of software test suites for combinatorial testing (CT) whose goal is to reveal faults triggered by interactions among parameters. Variants of IPO have been shown to produce test suites within reasonable amounts of time that are often not much larger than the smallest test suites known. When an entire test suite is executed, all faults that arise from t-way interactions for some fixed t are surely found. However, when tests are executed one at a time, it is desirable to detect a fault as early as possible so that it can be repaired. The basic IPO strategies of horizontal and vertical growth address test suite size, but not the early detection of faults. In this paper, the growth strategies in IPO are modified to attempt to evenly distribute the values of each parameter across the tests. Together with a reordering strategy that we add, this modification to IPO improves the rate of fault detection dramatically (improved by 31% on average). Moreover, our modifications always reduce generation time (2 times faster on average) and in some eases also reduce test suite size. 展开更多
关键词 combinatorial testing IPO test suite generation expected time to fault detection software under test
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