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X-Ray and Neutron Diffraction Studies on Thermal Parameters of Thalous Bromide
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作者 J.Bashir R.T.A.Khan +1 位作者 T.Ikeda KenichiOhshima 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2003年第2期189-190,共2页
Thermal parameters of TIBr were determined using both X-ray and neutron diffraction techniques. The data was analysed by Rietveld profile refinement procedure. From the neutron diffraction data, due to weak odd-order ... Thermal parameters of TIBr were determined using both X-ray and neutron diffraction techniques. The data was analysed by Rietveld profile refinement procedure. From the neutron diffraction data, due to weak odd-order reflections, it was not possible to determine the individual thermal parameters. TheX-ray diffraction measurements yielded BT1=0.296(5) nm2 and BBr=0.162(5) nm2. The overall isotropic value, B was 0.252(7) nm2 which is in good agreement with B=0.230(8) nm2 obtained from present neutron diffraction measurements. The present values are also in good agreement with theoretical estimates obtained from the shell models. 展开更多
关键词 thallium bromide Temperature factors Debye temperature Rietveld refinement Neutron diffraction X-ray diffraction
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