Time delay and integration （TDI） charge coupled device （CCD） noise sets a fundamental limit on image sensor performance, especially under low illumination in remote sensing applications. After introducing the comp...Time delay and integration （TDI） charge coupled device （CCD） noise sets a fundamental limit on image sensor performance, especially under low illumination in remote sensing applications. After introducing the complete sources of CCD noise, we study the effects of TDI operation mode on noise, and the relationship between different types of noise and number of the TDI stage. Then we propose a new technique to identify and measure sources of TDI CCD noise employing mathematical statistics theory, where theoretical analysis shows that noise estimated formulation converges well. Finally, we establish a testing platform to carry out experiments, and a standard TDI CCD is calibrated by using the proposed method. The experimental results show that the noise analysis and measurement methods presented in this paper are useful for modeling TDI CCDs.展开更多
This paper analyzes the operation parameters of the time delay and integration (TDI) line scan CCD camera, such as resolution, line rate, clock frequency, etc. and their mathematical relationship is deduced. By analyz...This paper analyzes the operation parameters of the time delay and integration (TDI) line scan CCD camera, such as resolution, line rate, clock frequency, etc. and their mathematical relationship is deduced. By analyzing and calculating these parameters, the working clocks of the TDI CCD line scan camera are designed, which guarantees the synchronization of the line scan rate and the camera movement speed. The IL-E2 TDI CCD of DALSA Co. is used as the sensor of the camera in the paper. The working clock generator used for the TDI CCD sensor is realized by using the programmable logic device (PLD). The experimental results show that the working clock generator circuit satisfies the requirement of high speed TDI CCD line scan camera.展开更多
The time delay integration charge coupled device(TDI CCD)is the key component in remote sensing systems.The paper analyzes the structure and the working principles of the device according to a customized TDI CCD chip....The time delay integration charge coupled device(TDI CCD)is the key component in remote sensing systems.The paper analyzes the structure and the working principles of the device according to a customized TDI CCD chip.Employing the special clock resources and large-scale phase locked logic(PLL)in field-programmable gate arrays(FPGA),a timing-driven approach is proposed,using which all timing signals including reset gate,horizontal and vertical timing signals,are implemented in one chip.This not only reduces printed circuit board(PCB)space,but also enhances the portability of the system.By studying and calculating CCD parameters thoroughly,load capacity and power consumption,package,etc,are compared between various candidates chips,and detailed comparison results are also listed in table.Experimental results show that clock generator and driving circuit satisfy the requirements of high speed TDI CCD.展开更多
基金Project supported by the National High Technology Research and Development Program of China (Grant No. 2006AA06A208)
文摘Time delay and integration （TDI） charge coupled device （CCD） noise sets a fundamental limit on image sensor performance, especially under low illumination in remote sensing applications. After introducing the complete sources of CCD noise, we study the effects of TDI operation mode on noise, and the relationship between different types of noise and number of the TDI stage. Then we propose a new technique to identify and measure sources of TDI CCD noise employing mathematical statistics theory, where theoretical analysis shows that noise estimated formulation converges well. Finally, we establish a testing platform to carry out experiments, and a standard TDI CCD is calibrated by using the proposed method. The experimental results show that the noise analysis and measurement methods presented in this paper are useful for modeling TDI CCDs.
基金Sponsored by the Research Fund of Harbin Institute of Technology (Grant No.HITMD 2001.18).
文摘This paper analyzes the operation parameters of the time delay and integration (TDI) line scan CCD camera, such as resolution, line rate, clock frequency, etc. and their mathematical relationship is deduced. By analyzing and calculating these parameters, the working clocks of the TDI CCD line scan camera are designed, which guarantees the synchronization of the line scan rate and the camera movement speed. The IL-E2 TDI CCD of DALSA Co. is used as the sensor of the camera in the paper. The working clock generator used for the TDI CCD sensor is realized by using the programmable logic device (PLD). The experimental results show that the working clock generator circuit satisfies the requirement of high speed TDI CCD line scan camera.
基金National High Technology Research and Development Program of China(863 Program)(No.2009AA7010102)
文摘The time delay integration charge coupled device(TDI CCD)is the key component in remote sensing systems.The paper analyzes the structure and the working principles of the device according to a customized TDI CCD chip.Employing the special clock resources and large-scale phase locked logic(PLL)in field-programmable gate arrays(FPGA),a timing-driven approach is proposed,using which all timing signals including reset gate,horizontal and vertical timing signals,are implemented in one chip.This not only reduces printed circuit board(PCB)space,but also enhances the portability of the system.By studying and calculating CCD parameters thoroughly,load capacity and power consumption,package,etc,are compared between various candidates chips,and detailed comparison results are also listed in table.Experimental results show that clock generator and driving circuit satisfy the requirements of high speed TDI CCD.
