Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hund...Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hundreds of nanometers, and it is difficult to characterize localized electronic properties of 2D materials at nanoscales. Herein, tip-enhanced Raman spectroscopy(TERS) is proposed to combine with KPFM to break this restriction. TERS scan is conducted on ReS2bubbles deposited on a rough Au thin film to obtain strain distribution by using the Raman peak shift. The localized contact potential difference(CPD) is inversely calculated with a higher spatial resolution by using strain measured by TERS and CPD-strain working curve obtained using conventional KPFM and atomic force microscopy. This method enhances the spatial resolution of CPD measurements and can be potentially used to characterize localized electronic properties of 2D materials.展开更多
Tip-enhanced Raman spectroscopy （TERS） is high-sensitivity and high spatial-resolution optical analytical technique with nanoscale resolution beyond the diffraction limit. It is also one of the most recent advances ...Tip-enhanced Raman spectroscopy （TERS） is high-sensitivity and high spatial-resolution optical analytical technique with nanoscale resolution beyond the diffraction limit. It is also one of the most recent advances in nanoscale chemical analysis. This review provides an overview of the state-of-art inTERS, in-depth information about the different available types of instruments including their （dis）advantages and capabilities. Finally, an overview about recent development in High-Vacuum TERS is given and some challenges are raised.展开更多
Tip-enhanced Raman spectrum(TERS) is a scanning probe technique for acquiring chemical information at high spatial resolution and with high chemical sensitivity. The sensitivity of TERS with atomic force microscopy(AF...Tip-enhanced Raman spectrum(TERS) is a scanning probe technique for acquiring chemical information at high spatial resolution and with high chemical sensitivity. The sensitivity of TERS with atomic force microscopy(AFM) system is mainly determined by the metalized tips. Here, we report a fabrication protocol for AFM-TERS tips that incorporate a copper(Cu) primer film between a gold(Au) layer and a Si AFM tip. They were fabricated by coating the Si tip with a 2 nm Cu layer prior to adding a 20 nm Au layer. For top illumination TERS experiments, these tips exhibited superior TERS performance relative to that observed for tips coated with Au only. Samples included graphene, thiophenol and brilliant cresyl blue. The results may derive from the surface roughness of the tip apex and a Cu/Au synergism of local surface plasmon resonances.展开更多
基金Project supported by the Zhejiang Provincial Natural Science Foundation of China (Grant No. LZ22A040003)the National Natural Science Foundation of China (Grant No. 52027809)。
文摘Electronic properties of two-dimensional(2D) materials can be strongly modulated by localized strain. The typical spatial resolution of conventional Kelvin probe force microscopy(KPFM) is usually limited in a few hundreds of nanometers, and it is difficult to characterize localized electronic properties of 2D materials at nanoscales. Herein, tip-enhanced Raman spectroscopy(TERS) is proposed to combine with KPFM to break this restriction. TERS scan is conducted on ReS2bubbles deposited on a rough Au thin film to obtain strain distribution by using the Raman peak shift. The localized contact potential difference(CPD) is inversely calculated with a higher spatial resolution by using strain measured by TERS and CPD-strain working curve obtained using conventional KPFM and atomic force microscopy. This method enhances the spatial resolution of CPD measurements and can be potentially used to characterize localized electronic properties of 2D materials.
文摘Tip-enhanced Raman spectroscopy （TERS） is high-sensitivity and high spatial-resolution optical analytical technique with nanoscale resolution beyond the diffraction limit. It is also one of the most recent advances in nanoscale chemical analysis. This review provides an overview of the state-of-art inTERS, in-depth information about the different available types of instruments including their （dis）advantages and capabilities. Finally, an overview about recent development in High-Vacuum TERS is given and some challenges are raised.
基金supported by the National Basic Research Program of China(2011YQ03012415,2011CB808700)the National Natural Science Foundation of China(21127901,233010,21121063)the Strategic Priority Research Program of the Chinese Academy of Sciences(XDB12020100)
文摘Tip-enhanced Raman spectrum(TERS) is a scanning probe technique for acquiring chemical information at high spatial resolution and with high chemical sensitivity. The sensitivity of TERS with atomic force microscopy(AFM) system is mainly determined by the metalized tips. Here, we report a fabrication protocol for AFM-TERS tips that incorporate a copper(Cu) primer film between a gold(Au) layer and a Si AFM tip. They were fabricated by coating the Si tip with a 2 nm Cu layer prior to adding a 20 nm Au layer. For top illumination TERS experiments, these tips exhibited superior TERS performance relative to that observed for tips coated with Au only. Samples included graphene, thiophenol and brilliant cresyl blue. The results may derive from the surface roughness of the tip apex and a Cu/Au synergism of local surface plasmon resonances.
