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聚合物ESD抑制器测试方法与性能研究
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作者 徐晓英 冯婉琳 +2 位作者 郭瑶 叶宇辉 甘瑛洁 《固体电子学研究与进展》 CAS 北大核心 2019年第1期64-71,共8页
比较了传输线脉冲(TLP)波形和人体金属模型(HMM)波形作为静电放电(ESD)防护器件测试注入波形时的测试精确度,强调了在动态测试中使用TLP的优势。从微观机理角度分析,计算了载流子输运方程与电流连续性方程,提出了聚合物材料ESD抑制器的... 比较了传输线脉冲(TLP)波形和人体金属模型(HMM)波形作为静电放电(ESD)防护器件测试注入波形时的测试精确度,强调了在动态测试中使用TLP的优势。从微观机理角度分析,计算了载流子输运方程与电流连续性方程,提出了聚合物材料ESD抑制器的防护性能表征参量。设计和搭建了等效ESD测试系统模型,通过TLP方法研究了膜状ESD抑制器的防护性能。结果表明,膜状聚合物ESD抑制器有良好的静态、动态防护特性,同时薄型覆膜结构更适合有高频多点防护需求的电路设计。 展开更多
关键词 静电放电防护器件 传输线脉冲波形 测试 静电放电抑制特性 石墨烯 屏蔽材料
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New DDSCR structure with high holding voltage for robust ESD applications 被引量:1
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作者 Zi-Jie Zhou Xiang-Liang Jin +1 位作者 Yang Wang Peng Dong 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第3期529-539,共11页
A novel dual direction silicon-controlled rectifier(DDSCR)with an additional P-type doping and gate(APGDDSCR)is proposed and demonstrated.Compared with the conventional low-voltage trigger DDSCR(LVTDDSCR)that has posi... A novel dual direction silicon-controlled rectifier(DDSCR)with an additional P-type doping and gate(APGDDSCR)is proposed and demonstrated.Compared with the conventional low-voltage trigger DDSCR(LVTDDSCR)that has positive and negative holding voltages of 13.371 V and 14.038 V,respectively,the new DDSCR has high positive and negative holding voltages of 18.781 V and 18.912 V in a single finger device,respectively,and it exhibits suitable enough positive and negative holding voltages of 14.60 V and 14.319 V in a four-finger device for±12-V application.The failure current of APGDDSCR is almost the same as that of LVT-DDSCR in the single finger device,and the four-finger APGDDSCR can achieve positive and negative human-body model(HBM)protection capabilities of 22.281 kV and 23.45 kV,respectively,under 40-V voltage of core circuit failure,benefitting from the additional structure.The new structure can generate a snapback voltage on gate A to increase the current gain of the parasitic PNP in holding voltage.Thus,a sufficiently high holding voltage increased by the structure can ensure that a multi-finger device can also reach a sufficient holding voltage,it is equivalent to solving the non-uniform triggering problem of multi-finger device.The operating mechanism and the gate voltage are both discussed and verified in two-dimensional(2D)simulation and experiemnt. 展开更多
关键词 dual direction silicon-controlled rectifier(DDSCR) failure current snapback gate voltage simulation transmission line pulsing(tlp)
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