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Thickness determination of MoS2,MoSe2,WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials 被引量:3
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作者 Najme S. Taghavi Patricia Gant +7 位作者 Peng Huang Iris Niehues Robert Schmidt Steffen Michaelis de Vasconcellos Rudolf Bratschitsch Mar Garcia-Hernandez Riccardo Frisenda Andres Castellanos-Gomez 《Nano Research》 SCIE EI CAS CSCD 2019年第7期1691-1695,共5页
Here,we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps,used for the deterministic placement of two-dimensional mater... Here,we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps,used for the deterministic placement of two-dimensional materials,by analyzing the red,green and blue channels of transmission-mode optical microscopy images of the samples.In particular,the blue channel transmittance shows a large and monotonic thickness dependence,making it a very convenient probe of the flake thickness.The method proves to be robust given the small flake-to-flake variation and the insensitivity to doping changes of MoS2.We also tested the method for MoSe2,WS2 and WSe2.These results provide a reference guide to identify the number of layers of this family of materials on transparent substrates only using optical microscopy. 展开更多
关键词 transition metal DICHALCOGENIDES optical identification TRANSPARENT substrate trasmittance
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