Performance modulation of ZnO optoelectronic devices in the presence of proper piezoelectric polarization charges has been widely reported, whereas relatively less work has been performed about the influence of photoe...Performance modulation of ZnO optoelectronic devices in the presence of proper piezoelectric polarization charges has been widely reported, whereas relatively less work has been performed about the influence of photoexcitation on piezotronics. In this stud~ we experimentally investigated the performance evolution of ZnO piezotronic strain sensor under various 365 nm UV irradiation densities. The device demonstrated a response ratio of -200 under no illumination and under -0.53% compressive strain, and the response time is approximately 0.3 s. However, tremendous performance degradation was observed with the increase in the illumination densi~, which is attributed to the W-modulated change in the free electron concentration and Schottky barrier height. It was observed that increased carrier density intensifies the screening effect and thus, the modulation ability of piezo-polarization charges weakens. Meanwhile, the deterioration of rectifying behavior at the interface under UV illumination also jeopardizes the device performance.展开更多
基金This work was supported by the National Basic Research Program of China (No. 2013CB932602), the Program of Introducing Talents of Discipline to Universities (No. B14003), National Natural Science Foundation of China (Nos. 51527802 and 51232001), Beijing Municipal Science & Technology Commission, and the Fundamental Research Funds for Central Universities.
文摘Performance modulation of ZnO optoelectronic devices in the presence of proper piezoelectric polarization charges has been widely reported, whereas relatively less work has been performed about the influence of photoexcitation on piezotronics. In this stud~ we experimentally investigated the performance evolution of ZnO piezotronic strain sensor under various 365 nm UV irradiation densities. The device demonstrated a response ratio of -200 under no illumination and under -0.53% compressive strain, and the response time is approximately 0.3 s. However, tremendous performance degradation was observed with the increase in the illumination densi~, which is attributed to the W-modulated change in the free electron concentration and Schottky barrier height. It was observed that increased carrier density intensifies the screening effect and thus, the modulation ability of piezo-polarization charges weakens. Meanwhile, the deterioration of rectifying behavior at the interface under UV illumination also jeopardizes the device performance.
基金This work was supported by the National Basic Research Program of China (No.2013CB932602),the Program of Introducing Talents of Discipline to Universities (No.B14003),National Natural Science Foundation of China (Nos.51527802,51232001,and 51572025),Beijing Municipal Science & Technology Commission,the Fundamental Research Funds for Central Universities,State Key Laboratory for Advanced Metals and Materials.