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Constant Stress Accelerated Life Tests for Vacuum Fluorescent Display Based on Least Square Method
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作者 张建平 王睿韬 《Journal of Southwest Jiaotong University(English Edition)》 2010年第1期45-50,共6页
To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the... To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method (LSM) to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month. 展开更多
关键词 vacuum fluorescent display Constant stress Accelerated life tests Least square method Lognormal distribution
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Constant-Step Stress Accelerated Life Test of VFD under Logarithmic Normal Distribution Case
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作者 张建平 谢秀中 赵科仁 《Journal of Shanghai Jiaotong university(Science)》 EI 2006年第1期14-17,共4页
In order to solve the life problem of vacuum fluorescent display (VFD) within shorter time, and reduce the life prediction cost, a constant-step stress accelerated life test was performed with its cathode temperature ... In order to solve the life problem of vacuum fluorescent display (VFD) within shorter time, and reduce the life prediction cost, a constant-step stress accelerated life test was performed with its cathode temperature increased. Statistical analysis was done by applying logarithmic normal distribution for describing the life, and least square method (LSM) for estimating logarithmic normal parameters. Self-designed special software was used to predict the VFD life. It is verified by numerical results that the VFD life follows logarithmic normal distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. The accurate calculation of the key parameters enables the rapid estimation of VFD life. 展开更多
关键词 vacuum fluorescent display accelerated life test logarithmic normal distribution
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