The fast and convenient demultiplex of optical vortex(OV) mode is crucial for its further application. We propose a novel approach that combines classic Young's doublet with an OV source to effectively identify th...The fast and convenient demultiplex of optical vortex(OV) mode is crucial for its further application. We propose a novel approach that combines classic Young's doublet with an OV source to effectively identify the OV mode through the analysis of interference patterns. The interference patterns of the OV source incident on the double slits can be perfectly illustrated by using both the classical double-slit interference method and the Huygens–Fresnel principle. The interference fringes will twist along the negative or positive direction of x axis when topological charge(TC)l>0 or l<0, and the degree of the movement varies with the TC, allowing for a quantitative display of the OV characteristics through the interference patterns. Additionally, we deduce analytically that the zeroth-order interference fringe has a linear relationship with the TC and the vertical position. These findings highlight the ability to identify the OV mode by analyzing the interference patterns produced by Young's doublet.展开更多
基金Project supported by the National Key Research and Development Program of China (Grant Nos.2020YFA0710100 and 2023YFA1407100)the National Natural Science Foundation of China (Grant Nos.92050102 and 12374410)+2 种基金the Jiangxi Provincial Natural Science Foundation (Grant No.20224ACB201005)the Fundamental Research Funds for the Central Universities (Grant Nos.20720230102 and 20720220033)China Scholarship Council (Grant No.202206310009)。
文摘The fast and convenient demultiplex of optical vortex(OV) mode is crucial for its further application. We propose a novel approach that combines classic Young's doublet with an OV source to effectively identify the OV mode through the analysis of interference patterns. The interference patterns of the OV source incident on the double slits can be perfectly illustrated by using both the classical double-slit interference method and the Huygens–Fresnel principle. The interference fringes will twist along the negative or positive direction of x axis when topological charge(TC)l>0 or l<0, and the degree of the movement varies with the TC, allowing for a quantitative display of the OV characteristics through the interference patterns. Additionally, we deduce analytically that the zeroth-order interference fringe has a linear relationship with the TC and the vertical position. These findings highlight the ability to identify the OV mode by analyzing the interference patterns produced by Young's doublet.
