Chike （accession number Su1900）, a Chinese native wheat （Triticum aestivum L.） variety, is resistant to the currently prevailing physiological races of Puccinia striiformis Westend. f. sp. tritici in China. Geneti...Chike （accession number Su1900）, a Chinese native wheat （Triticum aestivum L.） variety, is resistant to the currently prevailing physiological races of Puccinia striiformis Westend. f. sp. tritici in China. Genetic analysis indicated that resistance to the physiological race CY32 of the pathogen in the variety was controlled by one dominant gene. In this study, BSA （bulked segregant analysis） methods and SSRs （simple sequence repeats） marker polymorphic analysis are used to map the gene. The resistant and susceptible DNA bulks were prepared from the segregating F2 population of the cross between Taichung 29, a susceptible variety as maternal parent, and Chike as paternal parent. Over 400 SSR primers were screened, and five SSR markers Xwmc44, Xgwm259, Xwmc367, Xcfa2292, and Xbarc80 on the chromosome arm 1BL were found to be polymorphic between the resistant and the susceptible DNA bulks as well as their parents. Genetic linkage was tested on segregating F2 population with 200 plants, including 140 resistant and 60 susceptible plants. All the five SSR markers were linked to the stripe rust resistance gene in Chike. The genetic distances for the markers Xwmc44, Xgwm259, Xwmc367, Xcfa2292, and Xbarc80 to the target gene were 8.3 cM, 9.1 cM, 17.2 cM, 20.6 cM, and 31.6 cM, respectively. Analysis using 21 nulli-tetrasomic Chinese Spring lines further confirmed that all the five markers were located on chromosome lB. On the basis of the above results, it is reasonable to assume that the major stripe rust resistance gene YrChk in Chike was located on the chromosome arm 1BL, and its comparison with the other stripe rust resistance genes located on 1B suggested that YrChk may be a novel gene that provides the resistance against stripe rust in Chike. Exploration and utilization of resources of disease resistance genes in native wheat varieties will be helpful both to diversify the resistance genes and to amend the situation of resistance gene simplification in the commercial wheat cultivars in China.展开更多
A study was conducted on reducing the yield loss of wheat due to leaf rust caused by Puccinia triticina with foliar application of fungicides during the 2014-2015 and 2015-2016 growing seasons at the Wheat Research In...A study was conducted on reducing the yield loss of wheat due to leaf rust caused by Puccinia triticina with foliar application of fungicides during the 2014-2015 and 2015-2016 growing seasons at the Wheat Research Institute in Faisalabad, Pakistan. Three fungicides： Folicur （tebuconazole） at 300 mL/ha, Nativo （tebuconazole ＋ trifloxystrobin） at 300 g/ha and Tilt （propiconazole） at 500 mL/ha were applied single or two times to Morocco and Sehar-06 wheat varieties used in the trial. The trial plots were first sprayed at the Zadok＇s scale （ZS） 3 stage and second sprayed between ZS 4.3 and 5.4 stages. The greenness of the trial crop was measured using GreenSeeker. Foliar application of fungicides significantly reduced the loss of grain yield and 1,000-grain weight （TGW） of wheat due to leaf rust in comparison to the control without fungicides application. Of the three fungicides, two times spray of Nativo reduced the grain yield loss of leaf rust susceptible mega wheat variety Sehar-06 by 45%-56% and the loss of TGW by 42%, also giving the highest marginal return in the trial. Single application of Nativo was equally effective as two times spray of Folicur in reducing the loss of wheat grain yield. Two times spray of Folicur was found to be the second choice of fungicide for reducing the yield loss of wheat. The research identified suitable fungicides for reducing the yield loss of wheat due to leaf rust and also generated important scientific knowledge required to manage a sudden outbreak of leaf rust to ensure food security.展开更多
基金the National Natural Science Foundation of China (No. 30571157) the National Basic Research Program (973 Program) (No. 2006CB100203).
文摘Chike （accession number Su1900）, a Chinese native wheat （Triticum aestivum L.） variety, is resistant to the currently prevailing physiological races of Puccinia striiformis Westend. f. sp. tritici in China. Genetic analysis indicated that resistance to the physiological race CY32 of the pathogen in the variety was controlled by one dominant gene. In this study, BSA （bulked segregant analysis） methods and SSRs （simple sequence repeats） marker polymorphic analysis are used to map the gene. The resistant and susceptible DNA bulks were prepared from the segregating F2 population of the cross between Taichung 29, a susceptible variety as maternal parent, and Chike as paternal parent. Over 400 SSR primers were screened, and five SSR markers Xwmc44, Xgwm259, Xwmc367, Xcfa2292, and Xbarc80 on the chromosome arm 1BL were found to be polymorphic between the resistant and the susceptible DNA bulks as well as their parents. Genetic linkage was tested on segregating F2 population with 200 plants, including 140 resistant and 60 susceptible plants. All the five SSR markers were linked to the stripe rust resistance gene in Chike. The genetic distances for the markers Xwmc44, Xgwm259, Xwmc367, Xcfa2292, and Xbarc80 to the target gene were 8.3 cM, 9.1 cM, 17.2 cM, 20.6 cM, and 31.6 cM, respectively. Analysis using 21 nulli-tetrasomic Chinese Spring lines further confirmed that all the five markers were located on chromosome lB. On the basis of the above results, it is reasonable to assume that the major stripe rust resistance gene YrChk in Chike was located on the chromosome arm 1BL, and its comparison with the other stripe rust resistance genes located on 1B suggested that YrChk may be a novel gene that provides the resistance against stripe rust in Chike. Exploration and utilization of resources of disease resistance genes in native wheat varieties will be helpful both to diversify the resistance genes and to amend the situation of resistance gene simplification in the commercial wheat cultivars in China.
文摘A study was conducted on reducing the yield loss of wheat due to leaf rust caused by Puccinia triticina with foliar application of fungicides during the 2014-2015 and 2015-2016 growing seasons at the Wheat Research Institute in Faisalabad, Pakistan. Three fungicides： Folicur （tebuconazole） at 300 mL/ha, Nativo （tebuconazole ＋ trifloxystrobin） at 300 g/ha and Tilt （propiconazole） at 500 mL/ha were applied single or two times to Morocco and Sehar-06 wheat varieties used in the trial. The trial plots were first sprayed at the Zadok＇s scale （ZS） 3 stage and second sprayed between ZS 4.3 and 5.4 stages. The greenness of the trial crop was measured using GreenSeeker. Foliar application of fungicides significantly reduced the loss of grain yield and 1,000-grain weight （TGW） of wheat due to leaf rust in comparison to the control without fungicides application. Of the three fungicides, two times spray of Nativo reduced the grain yield loss of leaf rust susceptible mega wheat variety Sehar-06 by 45%-56% and the loss of TGW by 42%, also giving the highest marginal return in the trial. Single application of Nativo was equally effective as two times spray of Folicur in reducing the loss of wheat grain yield. Two times spray of Folicur was found to be the second choice of fungicide for reducing the yield loss of wheat. The research identified suitable fungicides for reducing the yield loss of wheat due to leaf rust and also generated important scientific knowledge required to manage a sudden outbreak of leaf rust to ensure food security.
