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x-射线前散射图像物体真实灰度级的图像处理
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作者 孙丽娜 巴德纯 +1 位作者 杨斌 原培新 《沈阳工业大学学报》 EI CAS 北大核心 2013年第3期329-332,共4页
为了准确提取物体的有效特征值,得到目标物体的真实灰度级,以前散射图像为例,建立了目标物体、背景物体及重叠区域灰度级之间的数学模型来描述物体间的重叠关系,把多个物体重叠问题简化为两个物体重叠问题.根据x-射线与物质相互作用关系... 为了准确提取物体的有效特征值,得到目标物体的真实灰度级,以前散射图像为例,建立了目标物体、背景物体及重叠区域灰度级之间的数学模型来描述物体间的重叠关系,把多个物体重叠问题简化为两个物体重叠问题.根据x-射线与物质相互作用关系、x-射线源类型、探测器通道数等对重叠关系模型进行转换、简化、推导,得到目标物体真实灰度级模型.将测得的80组灰度级代入目标物体真实灰度级模型中进行求解,结果表明,模型误差在10%以内,该模型算法有效可行. 展开更多
关键词 真实灰度级 图像处理 安全检查 x-射线探测 前散射图像 重叠效应 数学模型 物质分类
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水冷淬火
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《热处理工艺与设备:英文版》 2005年第3期30-31,共2页
SY508-3-140[篇名]An Investigation into Application of Ceramic-Metal FGM Plating to Small High Speed Gasoline Engines,SY508-3-141[篇名] An X-ray method for determination of crystallinity as a function of depth from a ... SY508-3-140[篇名]An Investigation into Application of Ceramic-Metal FGM Plating to Small High Speed Gasoline Engines,SY508-3-141[篇名] An X-ray method for determination of crystallinity as a function of depth from a polymer surface,…… 展开更多
关键词 水冷淬火 金属陶瓷 FGM x-射线探测 结晶性质
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Calculation of the coefficient and dynamics of water diffusion in graphite joints
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作者 WANG Jun LIU Wen-bin 《Journal of Marine Science and Application》 2006年第2期65-70,共6页
The coefficient and dynamics of water diffusion in adhesive-graphite joints were calculated in-situ with energy dispersive X-ray (EDX) analysis, a method that is significantly simpler than elemental analysis. Water di... The coefficient and dynamics of water diffusion in adhesive-graphite joints were calculated in-situ with energy dispersive X-ray (EDX) analysis, a method that is significantly simpler than elemental analysis. Water diffusion coefficient and dynamics of adhesive-graphite joints treated by different surface treatment methods were also investigated. Calculation results indicated that the water diffusion rate in adhesive-graphite joints treated by sandpaper was higher than that treated by chemical oxidation or by silane couple agent. Also the durability of graphite joints treated by coupling agent is superior to that treated by chemical oxidation or sandpaper burnishing. 展开更多
关键词 adhesive-graphite joints diffusion coefficient diffusion dynamics energy dispersive x-ray (EDX)
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Development of Electron Temperature Measuring System by Silicon Drift Detector
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作者 SONG Xianying YANG Jinwei LIAO Min LI Xu ZHANG Yipo FUBingzhong LUO Cuiwen 《Southwestern Institute of Physics Annual Report》 2005年第1期20-22,共3页
The soft X-ray spectroscopy, laser Thomson scattering and electron cyclotron emission ( ECE ) are usually adopted for electron temperature measurement in fusion research of magnetic confinement. The particular soft ... The soft X-ray spectroscopy, laser Thomson scattering and electron cyclotron emission ( ECE ) are usually adopted for electron temperature measurement in fusion research of magnetic confinement. The particular soft X-ray spectroscopy has the very good spatial-temporal resolution and smaller measuring error than laser Thomson scattering, a close spatial-temporal resolution to ECE, absolute measurement ability, and smaller influence by suprathermal and runaway electrons than ECE. 展开更多
关键词 Soft x-ray spectroscopy Silicon drift detector Electron temperature
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A statistical approach to fit Gaussian part of full-energy peaks from Si(PIN) and SDD X-ray spectrometers 被引量:4
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作者 LI Zhe TUO XianGuo +1 位作者 SHI Rui YANG JianBo 《Science China(Technological Sciences)》 SCIE EI CAS 2014年第1期19-24,共6页
A new statistical fitting approach, named Statistical Distribution-Based Analytic (SDA) method, is proposed to fit single Gaussian-shaped Ka and KI3 X-ray peaks recorded by Si(PIN) and silicon drift detector (SDD... A new statistical fitting approach, named Statistical Distribution-Based Analytic (SDA) method, is proposed to fit single Gaussian-shaped Ka and KI3 X-ray peaks recorded by Si(PIN) and silicon drift detector (SDD). In this method, we use the dis- crete distribution theory to calculate standard deviation of energy resolution a. The calibration of cr and energy (E) for two de- tectors between the energy ranges of 4.5-26 keV are also completed by measuring characteristic X-ray spectra of nineteen types of pure elements. With the spectrum fraction (SF) parameter proposed in this paper, the SDA method can be used to re- solve overlapping peaks. In measured spectra, the Gaussian part of X-ray peaks can be fitted by a Gaussian function with two parameters, ~ and SF. This new fitting approach is simpler than traditional methods and it achieves relatively good results when fitting the complex X-ray spectra of national standard alloy samples detected by Si(PIN) and SDD detectors. The 3(2 values are obtained for each spectrum to assess fitting results, and the SDA fitting method gives a preferable fit for the SDD detector. 展开更多
关键词 Gaussian distribution Si(PIN) SDD EDXRF standard deviation of energy resolution
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A new solid-conversion gas detector for high energy X-ray industrial computed tomography
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作者 周日峰 陈伟民 段晓礁 《Optoelectronics Letters》 EI 2011年第5期337-340,共4页
A new type of solid-conversion gas detector is investigated for high energy X-ray industrial computed tomography (HECT). The conversion efficiency is calculated by using the EGSnrc Monte Carlo code on the Linux platfo... A new type of solid-conversion gas detector is investigated for high energy X-ray industrial computed tomography (HECT). The conversion efficiency is calculated by using the EGSnrc Monte Carlo code on the Linux platform to simulate the transport process of photons and electrons in the detector. The simulation results show that the conversion efficiency could be more than 65%, if the X-ray beam width is less than about 0.2 mm, and a tungsten slab with 0.2 mm thickness and 30 mm length is employed as a radiation conversion medium. Meanwhile the results indicate that this new detector has higher conversion efficiency as well as less volume. Theoretically this new kind of detector could take place of the traditional scintillation detector for HECT. 展开更多
关键词 Computer operating systems Computerized tomography Conversion efficiency Gas detectors High energy physics Multiphoton processes TUNGSTEN X rays
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Lead-free perovskites: growth, properties, and applications 被引量:3
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作者 Fan Yang Aocheng Wang +4 位作者 Shuai Yue Wenna Du Shaoli Wang Xiaotao Zhang Xinfeng Liu 《Science China Materials》 SCIE EI CAS CSCD 2021年第12期2889-2914,共26页
Lead halide perovskites have attracted extensive attention in recent years because of their excellent photoelectronic properties, such as high absorption coefficients,carrier mobilities, defect tolerances, and photolu... Lead halide perovskites have attracted extensive attention in recent years because of their excellent photoelectronic properties, such as high absorption coefficients,carrier mobilities, defect tolerances, and photoluminescence efficiencies. However, a key issue hindering their commercial application is the toxicity of lead. Replacing lead with other nontoxic elements is a promising solution to this problem.Considering their atomic radii, relative atomic masses, and electron arrangements, perovskites based on Sn, Bi, Sb, and other elements instead of Pb have been widely synthesized.Here, we summarized the growth methods, photoelectric properties, and device applications of these lead-free perovskites. First, we introduced several common growth methods for lead-free perovskites, including solution methods,solid-state reaction, and chemical vapor deposition methods.Second, we discussed the photoelectric properties and methods for optimizing these properties of lead-free perovskites with different structure dimensions. Finally, the applications of lead-free perovskites in solar cells, light-emitting diodes,and X-ray detectors were examined. This review also provides suggestions for future research on lead-free perovskites. 展开更多
关键词 lead-free perovskites growth methods bandgap PHOTOLUMINESCENCE solar cells
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Application of Mythen detector:In-situ XRD study on the thermal expansion behavior of metal indium 被引量:1
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作者 Rong Du ZhongJun Chen +3 位作者 Quan Cai JianLong Fu Yu Gong ZhongHua Wu 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS CSCD 2016年第7期62-69,共8页
A Mythen detector has been equipped at the beamline 4B9A of Beijing Synchrotron Radiation Facility (BSRF), which is expected to enable BSRF to perform time-resolved measurement of X-ray diffraction (XRD) full-prof... A Mythen detector has been equipped at the beamline 4B9A of Beijing Synchrotron Radiation Facility (BSRF), which is expected to enable BSRF to perform time-resolved measurement of X-ray diffraction (XRD) full-profiles. In this paper, the thermal expansion behavior of metal indium has been studied by using the in-situ XRD technique with the Mythen detector. The indium was heated from 303 to 433 K with a heating rate of 2 K/rain. The in-situ XRD full-profiles were collected with a rate of one profile per 10 seconds. Rietveld refinement was used to extract the structural parameters. The results demonstrate that these collected quasi-real-time XRD profiles can be well used for structural analysis. The metal indium was found to have a nonlinear thermal expansion behavior from room temperature to the melting point (429.65 K). The a-axis of the tetragonal unit cell expands with a biquadratic dependency on temperature, while the c-axis contracts with a cubic dependency on temperature. By the time-resolved XRD measurements, it was observed that the [200] preferred orientation can maintain to about 403.15 K. While (110) is the last and detectable crystal plane just before melting of the polycrystalline indium foil. This study is not only beneficial to the application of metal indium, but also exhibits the capacity of in-situ time-resolved XRD measurements at the X-ray diffraction station of BSRF. 展开更多
关键词 Mythen detector thermal expansion Rietveld refinement XRD indium foil
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