Sintered plates of 5mol% yttria-partially-stabilized zirconia have been implanted at room temperature with 5 ×1015to 2 ×1017 Fe+ ions/cm2 at 140 KeV. Electrical measurement, Rutherford backscattering spec-tr...Sintered plates of 5mol% yttria-partially-stabilized zirconia have been implanted at room temperature with 5 ×1015to 2 ×1017 Fe+ ions/cm2 at 140 KeV. Electrical measurement, Rutherford backscattering spec-troscopy(RBS), Raman spectroscopy and X-ray photoelec-tron spectroscopy(XPS) have been used to study the surface electrical properties and the structure of the implanted layer before and after thermal annealing treatment in N2.展开更多
文摘Sintered plates of 5mol% yttria-partially-stabilized zirconia have been implanted at room temperature with 5 ×1015to 2 ×1017 Fe+ ions/cm2 at 140 KeV. Electrical measurement, Rutherford backscattering spec-troscopy(RBS), Raman spectroscopy and X-ray photoelec-tron spectroscopy(XPS) have been used to study the surface electrical properties and the structure of the implanted layer before and after thermal annealing treatment in N2.
