期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
A novel antifuse structure based on amorphous bismuth zinc niobate thin films 被引量:2
1
作者 王刚 李威 +3 位作者 李平 李祖雄 范雪 姜晶 《Journal of Semiconductors》 EI CAS CSCD 2012年第8期44-47,共4页
A novel antifuse structure with amorphous bismuth zinc niobate(a-BZN) dielectrics was proposed.The characteristics of the a-BZN antifuse were investigated.Programming direction of up to down was chosen to rupture th... A novel antifuse structure with amorphous bismuth zinc niobate(a-BZN) dielectrics was proposed.The characteristics of the a-BZN antifuse were investigated.Programming direction of up to down was chosen to rupture the a-BZN antifuse.The breakdown voltage of the a-BZN antifuse was obtained at a magnitude of 6.56 V.A large off-state resistance of more than 1 GΩfor the a-BZN antifuse was demonstrated.The surface micrograph of the ruptured a-BZN antifuses was illustrated.Programming characteristics with the programming time of 0.46 ms and on-state properties with the average resistance value of 26.1Ωof the a-BZN antifuse were exhibited.The difference of characteristics of the a-BZN antifuse from that of a cubic pyrochlore bismuth zinc niobate(cp-BZN) antifuse and gate oxide antifuse was compared and analyzed. 展开更多
关键词 amorphous bismuth zinc niobate thin tilm antithse comparison
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部