The surface morphology of buffer layer yttrium-stabilized zirconia （YSZ） of YBa2CuaO7-σ （YBCO） high temperature superconducting films relies on a series of controllable experimental parameters. In this work, we f...The surface morphology of buffer layer yttrium-stabilized zirconia （YSZ） of YBa2CuaO7-σ （YBCO） high temperature superconducting films relies on a series of controllable experimental parameters. In this work, we focus on the influence of pulsed laser frequency and target crystalline type on surface morphology of YSZ films deposited by pulsed laser deposition （PLD） on rolling assisted biaxially textured substrate tapes. Usually two kinds of particles are observed in the YSZ layer： randomly distributed ones on the whole film and self-assembled ones along grain boundaries. SEM images are used to prove that particles can be partly removed when choosing dense targets of single crystalline. Lower frequency of pulsed laser also contributes to a smoother film surface. TEM images are used to view the crystalline structure of thin film. Thus we can obtain a basic understanding of how to prepare a particle-free YSZ buffer layer for YBCO in optimized conditions using PLD. The YBCO layer with nice structure and critical current density of around 5 MA/cm2 can be reached on smooth YSZ samples.展开更多
Pure mesoporous ZrO2 thin film with two-dimensional hexagonal framework mesostructure has been successfully prepared by using a nonionic triblock copolymer as the structure-directing agent and ZrCl4 as the zirconi...Pure mesoporous ZrO2 thin film with two-dimensional hexagonal framework mesostructure has been successfully prepared by using a nonionic triblock copolymer as the structure-directing agent and ZrCl4 as the zirconia source through evaporation-induced self-assembly approach. The resulting materials were characterized by X-ray diffraction, scanning electron microscope, and nitrogen adsorption measurements. The obtained mesoporous ZrO2 thin film has a nanocrystalline inorganic framework (tetragonal zirconia) and narrowly distributed mesopore size (67 nm in diameter).展开更多
The moment method in statistical (SMM) dynamics is used to study the thermodynamic quantities of ZrO2 thin films taking into account the anharmonicity effects of the lattice vibrations. The average lattice constant, t...The moment method in statistical (SMM) dynamics is used to study the thermodynamic quantities of ZrO2 thin films taking into account the anharmonicity effects of the lattice vibrations. The average lattice constant, thermal expansion coefficient and specific heats at the constant volume of ZrO2 thin films are calculated as a function of temperature, pressure and thickness of thin film. SMM calculations are performed using the Buckingham potential for the ZrO2 thin films. In the present study, the influence of temperature, pressure and the size on the thermodynamic quantities of ZrO2 thin film have been studied using three different interatomic potentials. We discuss temperature and thickness dependences of some thermodynamic quantities of ZrO2 thin films and we compare our calculated results with those of the experimental results.展开更多
The (h00) oriented YSZ (yttria-stabilized zirconia) buffer layers were grown successfully on (1120) and(1102) sapphire plane substrates by rf. planar target magnetron sputtering method. The effect of different dep-os...The (h00) oriented YSZ (yttria-stabilized zirconia) buffer layers were grown successfully on (1120) and(1102) sapphire plane substrates by rf. planar target magnetron sputtering method. The effect of different dep-osition conditions on the structure of YSZ films was studied X-ray diffraction rock curve and electron channel-ling pattern (ECP) showed that the YSZ films has highly oriented nature. YBCO (Y BaCuO) films were depos-ited on the YSZ / (1120) Al_2O_3 and (1102) Al_2O_3, substrate by in situ de inverted cyhdrical target magnetronsputtering method. T_c≥88K and J_c=1O × 10￣6A / cm￣2 at 77 K were achieved展开更多
The yttria-stabilized zirconia(YSZ)film was fabricated on the La 0.8 Sr 0.2 MnO 3(LSM)substrate by electrochemical deposition.The effects of electrochemical deposition conditions on morphological structure of Y(OH) 3 ...The yttria-stabilized zirconia(YSZ)film was fabricated on the La 0.8 Sr 0.2 MnO 3(LSM)substrate by electrochemical deposition.The effects of electrochemical deposition conditions on morphological structure of Y(OH) 3 -Zr(OH) 4 film were studied.The optimal conditions for depositing homogeneous and compact hydroxide film were obtained.The experimental results show that the density of the electrophoretic deposition film is increased remarkably if electrochemical deposition is applied to fill in the pores.展开更多
基金Supported by the ITER Project of the Ministry of Science and Technology of China under Grant No 2011GB113004the Shanghai Commission of Science and Technology under Grant No 11DZ1100402the Youth Fund of the National Natural Science Foundation of China under Grant No 11204174
文摘The surface morphology of buffer layer yttrium-stabilized zirconia （YSZ） of YBa2CuaO7-σ （YBCO） high temperature superconducting films relies on a series of controllable experimental parameters. In this work, we focus on the influence of pulsed laser frequency and target crystalline type on surface morphology of YSZ films deposited by pulsed laser deposition （PLD） on rolling assisted biaxially textured substrate tapes. Usually two kinds of particles are observed in the YSZ layer： randomly distributed ones on the whole film and self-assembled ones along grain boundaries. SEM images are used to prove that particles can be partly removed when choosing dense targets of single crystalline. Lower frequency of pulsed laser also contributes to a smoother film surface. TEM images are used to view the crystalline structure of thin film. Thus we can obtain a basic understanding of how to prepare a particle-free YSZ buffer layer for YBCO in optimized conditions using PLD. The YBCO layer with nice structure and critical current density of around 5 MA/cm2 can be reached on smooth YSZ samples.
文摘Pure mesoporous ZrO2 thin film with two-dimensional hexagonal framework mesostructure has been successfully prepared by using a nonionic triblock copolymer as the structure-directing agent and ZrCl4 as the zirconia source through evaporation-induced self-assembly approach. The resulting materials were characterized by X-ray diffraction, scanning electron microscope, and nitrogen adsorption measurements. The obtained mesoporous ZrO2 thin film has a nanocrystalline inorganic framework (tetragonal zirconia) and narrowly distributed mesopore size (67 nm in diameter).
文摘The moment method in statistical (SMM) dynamics is used to study the thermodynamic quantities of ZrO2 thin films taking into account the anharmonicity effects of the lattice vibrations. The average lattice constant, thermal expansion coefficient and specific heats at the constant volume of ZrO2 thin films are calculated as a function of temperature, pressure and thickness of thin film. SMM calculations are performed using the Buckingham potential for the ZrO2 thin films. In the present study, the influence of temperature, pressure and the size on the thermodynamic quantities of ZrO2 thin film have been studied using three different interatomic potentials. We discuss temperature and thickness dependences of some thermodynamic quantities of ZrO2 thin films and we compare our calculated results with those of the experimental results.
文摘The (h00) oriented YSZ (yttria-stabilized zirconia) buffer layers were grown successfully on (1120) and(1102) sapphire plane substrates by rf. planar target magnetron sputtering method. The effect of different dep-osition conditions on the structure of YSZ films was studied X-ray diffraction rock curve and electron channel-ling pattern (ECP) showed that the YSZ films has highly oriented nature. YBCO (Y BaCuO) films were depos-ited on the YSZ / (1120) Al_2O_3 and (1102) Al_2O_3, substrate by in situ de inverted cyhdrical target magnetronsputtering method. T_c≥88K and J_c=1O × 10￣6A / cm￣2 at 77 K were achieved
文摘The yttria-stabilized zirconia(YSZ)film was fabricated on the La 0.8 Sr 0.2 MnO 3(LSM)substrate by electrochemical deposition.The effects of electrochemical deposition conditions on morphological structure of Y(OH) 3 -Zr(OH) 4 film were studied.The optimal conditions for depositing homogeneous and compact hydroxide film were obtained.The experimental results show that the density of the electrophoretic deposition film is increased remarkably if electrochemical deposition is applied to fill in the pores.
