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Growth of Strained Si_(1-x)Ge_x Layer by UV/UHV/CVD
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作者 胡辉勇 张鹤鸣 +6 位作者 戴显英 李开成 王伟 朱永刚 王顺祥 崔晓英 王喜媛 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2005年第4期641-644,共4页
Strained Si_ 1-xGe_x and Si materials are successfully grown on Si substrate by ultraviolet light chemical vapor deposition under ultrahigh vacuum at a low substrate temperature of 450℃ and 480℃,respectively.At such... Strained Si_ 1-xGe_x and Si materials are successfully grown on Si substrate by ultraviolet light chemical vapor deposition under ultrahigh vacuum at a low substrate temperature of 450℃ and 480℃,respectively.At such low temperature,autodoping effects from the substrate and interdiffusion effects at each interface could be suppressed efficiently.The strained Si_ 1-xGe_x and multilayer Si_ 1-xGe_x/Si structures are examined by X-ray diffraction,SMIS,etc.,and it is found that the materials have good crystallinity and the rising and falling edges are steep.The technique has a capability of growing high-quality Si_ 1-xGe_x/Si strained layers. 展开更多
关键词 Si_ 1-xGe_x ultrahigh vacuum ultraviolet light chemical vapor deposition
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