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Characteristics of Schottky Barrier Junction Based on Hexagonal Microtube ZnO
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作者 GAOHui LIYan YANGLi-ping DENGHong 《Semiconductor Photonics and Technology》 CAS 2005年第2期85-88,106,共5页
Hexagonal microtube ZnO was firstly grown on single crystal p-Si (111) substrates by hydrothermal method, and fabricated Ag/n-ZnO and Au/n-ZnO Schottky junction. Schottky effective barrier heights were calculated by I... Hexagonal microtube ZnO was firstly grown on single crystal p-Si (111) substrates by hydrothermal method, and fabricated Ag/n-ZnO and Au/n-ZnO Schottky junction. Schottky effective barrier heights were calculated by I-V measurement. It is confirmed that the presence of a large amount of surface states related possibly to lattice imperfections existed near the surface leads to the pinning of the surface Fermi level at 0.35eV below the conduction-band edge. Then the fabricated Schottky barrier junctions are evaluated for their use as UV photodetectors. 展开更多
关键词 ZNO Schottky barrier junction Characteristic Barrier height Surface state UV photodetector Spectral responsivity
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