Experimental Research of the Radiator Thermal Performance Test Equipment and Its Application in Heating System

Radiator thermal performance test equipment plays a key role in the processing of developing a new type of heat radiator and its application products.The precise of temperature controlling,temperature measuring andflow measuring are the vital factors for a radiator thermal performance test equipment.Based on the above back-ground,this paper improves the measurement and control system of radiator thermal performance test equip-ment,which improves the accuracy of the radiator thermal performance test equipment.This paper also optimizes the software and hardware system simultaneously so as to improve the precision of the auto-test system of test equipment.Theflow rate ranges from 175 kg/h to 178 kg/h under different conditions.The average is 176.5 kg/h and the deviation rates are from 1.62%to 1.97%.The heat produced under various conditions is different.The maximum is 4.3 kW and the minimum is 4.2 kW for condition 1,the maximum is 3.3 kW and the minimum is 3.2 kW for condition 2 and the maximum is 1.95 kW and the minimum is 1.89 kW for condition 3.However,the deviation rate is about 2.9%,which shows that the device has high stability and high precision.This paper studies a new electronic heat cost allocate meter test method by radiator thermal performance test equipment at the same time.This paper tests temperature changes through four measures points and gets a result appeared as a heat backup which should be avoided when using in the test of electronic heat cost allocate meter.Some experiences and references could be gained for further research in the heating system from this test and research.

Simulation and analysis of polycrystalline silicon photovoltaic cells surface color differences based on transfer matrix method

Following the previous work,in this paper,the antireflective films thicknesses,refractive indexes and reflectance spectra of different color categories of the polycrystalline silicon cells are tested and compared.It is found that the color difference of polycrystalline silicon cells is mainly caused by the antireflective film.Then the matrix transfer method is used to simulate the reflection spectra according to the actual tested parameters of the samples,and the effectiveness of the simulation is verified.Finally,according to the distribution of the spectral solar irradiance,the total solar absorption of the polycrystalline silicon cells with different antireflective film thicknesses is simulated.The optimal value of the antireflective film thickness of the polycrystalline silicon cell is calculated.This study has important guiding significance for photovoltaic(PV)enterprises to realize the optimal production of plasma enhanced chemical vapor deposition(PECVD)process in production.