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Beryllium Surface Modified by B Ion Implantation
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作者 胡仁元 杨玉石 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 1989年第3期161-163,共3页
Beryllium is implanted with 100 keV, 2×10^(17) B/cm^2 and post-implanted sample is annealed at 650℃ for 1 h.Hardness measurement indicates that the hardness increases with implantation and can further be modifie... Beryllium is implanted with 100 keV, 2×10^(17) B/cm^2 and post-implanted sample is annealed at 650℃ for 1 h.Hardness measurement indicates that the hardness increases with implantation and can further be modified by post-implantation heat treatment. Profile measurement shows that implantation causes contamination on the surface of beryllium. During annealing boron diffuses out of beryllium and carbon on surface diffuses into beryllium. Beryllium surface is modified by composition change and carbide formation. 展开更多
关键词 ion implantation BERYLLIUM DIFFUSION
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