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不同施肥处理对水稻根表铁和砷形态的影响 被引量:16
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作者 陈学萍 朱永官 +4 位作者 洪米娜 王新军 Gault A G Charnock J M Polya D A 《环境化学》 CAS CSCD 北大核心 2008年第2期231-234,共4页
采用XAFS研究盆栽试验砷污染土壤中添加不同肥料后,苗期水稻根表铁膜和砷的矿物学特征.Fe的K边EXAFS谱表明,铁膜主要由2-line水铁矿组成,还有少部分针铁矿和赤铁矿等晶体矿;As的EX-AFS谱显示,除了KNO3和K2SO4处理外,其余处理的铁膜中砷... 采用XAFS研究盆栽试验砷污染土壤中添加不同肥料后,苗期水稻根表铁膜和砷的矿物学特征.Fe的K边EXAFS谱表明,铁膜主要由2-line水铁矿组成,还有少部分针铁矿和赤铁矿等晶体矿;As的EX-AFS谱显示,除了KNO3和K2SO4处理外,其余处理的铁膜中砷以三价砷为主.KNO3处理显著减少了水稻根表铁膜的形成,而且抑制了水稻对砷的吸收.不同的肥料可以影响铁膜中砷的存在形态. 展开更多
关键词 X-射线吸收近边结构(XANES) X-射线吸收精细结构(XAFS) 水稻 铁膜 肥料
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X-ray Multiple Diffraction Topographic Imaging Technique For Growth History Study of Habit Modifying Impurity Doped Crystals 被引量:1
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作者 LAI X. MA C. +1 位作者 K. J. Robert M. C. Miller 《Chemical Research in Chinese Universities》 SCIE CAS CSCD 2004年第4期411-416,共6页
A novel crystal characterization instrument has been built up in which a combination of X-ray multiple diffraction and X-ray topography is applied to enabling the cross-correlation between micro-crystallographic symme... A novel crystal characterization instrument has been built up in which a combination of X-ray multiple diffraction and X-ray topography is applied to enabling the cross-correlation between micro-crystallographic symmetry and its spatial dependence in relation to lattice defects. This facility is used to examine, in a self-consistent manner, growth sector-dependant changes to both the crystallographic structure and the lattice defects associated with the action of habit-modifying additives in a number of representative crystal growth systems. In addition, the new instrument can be used to probe micro-crystallographic aspects(such as distortion to crystal symmetry) and relate these in a spatially resolved manner to the crystal defect structure in crystals doped with known habit modifiers. 展开更多
关键词 X-ray diffraction X-ray multiple diffraction X-ray topography Habit modification Crystal growth Growth defects
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The Characterisation of Residual Strain in Ensis siliqua Shells
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作者 D. J. Scurr R. J. Cernik +2 位作者 S. P. Thompson P. M. Mummery S. J. Eichhorn 《Journal of Bionic Engineering》 SCIE EI CSCD 2006年第1期33-38,共6页
This study reports the variation of residual strains within the posterior ventral area of the Ensis siliqua mollusc shell, as determined using glancing incidence synchrotron X-ray diffraction. The outer layer of this ... This study reports the variation of residual strains within the posterior ventral area of the Ensis siliqua mollusc shell, as determined using glancing incidence synchrotron X-ray diffraction. The outer layer of this structure exhibits a tensile strain, in contrast to a compressive strain observed within the inner layer. Fluctuations in unit cell parameters for the inner layer have been determined, showing that the microscopic prismatic layer of the structure exhibits a compressive strain orientated parallel to the surface of the shell. This is thought to enhance the crack deflection properties of this layer, and aid in resisting catastrophic failure. Further analysis of residual strains has been performed using the same method, throughout several stages of compressive testing of the anterior dorsal region of the shell. This identified no variation in residual strains at various levels of loading, and it is therefore proposed that load may be transferred via the organic matrix of mollusc shell structures. A Raman spectroscopic investigation, comparing whole and powdered shell with non-biogenic aragonite, has shown that residual strains are also present in this analagous material which is devoid of organic content. This indicates that the observed strain is not entirely due to the organic matrix. 展开更多
关键词 Ensis siliqua shell residual strain synchrostron X-ray diffraction
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