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Effects of coupling and phase imperfections in programmable photonic hexagonal waveguide meshes 被引量:2
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作者 IMAN ZAND WIM BOGAERTS 《Photonics Research》 SCIE EI CSCD 2020年第2期211-218,共8页
We present a study of the effect of imperfections on the transmission and crosstalk in programmable photonic meshes with feedback loops consisting of tunable couplers and phase shifters.The many elements in such a mes... We present a study of the effect of imperfections on the transmission and crosstalk in programmable photonic meshes with feedback loops consisting of tunable couplers and phase shifters.The many elements in such a mesh can generate a multitude of parasitic paths when the couplers and phase shifters deviate even slightly from their nominal value.Performing Monte Carlo simulations,we show that small stochastic imperfections in the phase and coupling(<1.0%)can introduce unwanted interferences and resonances and significantly deteriorate the frequency response of the circuit.We also demonstrate that,in the presence of imperfections,the programming strategy of the unused couplers can reduce effects of such parasitics. 展开更多
关键词 WAVEGUIDE COUPLING phase
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Accurate extraction of fabricated geometry using optical measurement 被引量:1
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作者 YUFEI XING JIAXING DONG +2 位作者 SARVAGYA DWIVEDI UMAR KHAN WIM BOGAERTS 《Photonics Research》 SCIE EI 2018年第11期1008-1020,共13页
We experimentally demonstrate extraction of silicon waveguide geometry with subnanometer accuracy using optical measurements. Effective and group indices of silicon-on-insulator(SOI) waveguides are extracted from the ... We experimentally demonstrate extraction of silicon waveguide geometry with subnanometer accuracy using optical measurements. Effective and group indices of silicon-on-insulator(SOI) waveguides are extracted from the optical measurements. An accurate model linking the geometry of an SOI waveguide to its effective and group indices is used to extract the linewidths and thicknesses within respective errors of 0.37 and0.26 nm on a die fabricated by IMEC multiproject wafer services. A detailed analysis of the setting of the bounds for the effective and group indices is presented to get the right extraction with improved accuracy. 展开更多
关键词 MZI ACCURATE EXTRACTION MEASUREMENT
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