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Rerouting end-face-TIR capable rays to significantly increase evanescent wave signal power
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作者 Jianjun Ma Yasser Chiniforooshan +3 位作者 Huacai Chen Jiahua Chen Wojtek J. Bock Andrea Cusano 《Chinese Optics Letters》 SCIE EI CAS CSCD 2011年第4期18-20,共3页
The critical findings associated with end-face total internal reflection (TIR) phenomemon we proved before are reported. In particular, these findings reveal that the end-face-TIR capable rays experience enormous mo... The critical findings associated with end-face total internal reflection (TIR) phenomemon we proved before are reported. In particular, these findings reveal that the end-face-TIR capable rays experience enormous mode mixing when encountering a roughened end face. As a result, 94% of the overall detectable power is contributed by this effect. With a smooth fiber end face, this figure is mere 52%. We interpret the mechanism behind these unusual phenomena and its significance for the performance enhancement of fiber optic evanescent wave sensor. 展开更多
关键词 Refractive index
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